Yoshiaki SHISHIDO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device
- Patent number 10,768,186
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Eiji Takaya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection Device
- Publication number 20180052183
- Publication date Feb 22, 2018
- Hitachi High-Technologies Corporation
- Eiji TAKAYA
- G01 - MEASURING TESTING