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Yoshichika MIWA
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Wavefront measurement device and optical system assembly device
Patent number
10,527,518
Issue date
Jan 7, 2020
Mitsubishi Electric Corporation
Hitomi Ono
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
WAVEFRONT MEASURING APPARATUS AND WAVEFRONT MEASURING METHOD
Publication number
20230304891
Publication date
Sep 28, 2023
Mitsubishi Electric Corporation
Akihiro FUJIE
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT MEASUREMENT DEVICE AND OPTICAL SYSTEM ASSEMBLY DEVICE
Publication number
20190242783
Publication date
Aug 8, 2019
Mitsubishi Electric Corporation
Hitomi ONO
G01 - MEASURING TESTING
Information
Patent Application
LASER RADAR DEVICE
Publication number
20160291137
Publication date
Oct 6, 2016
Mitsubishi Electric Corporation
Takeshi SAKIMURA
G01 - MEASURING TESTING