Yoshichika Nakaya

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Kasugai-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing a memory device
- Patent number 7,352,638
- Issue date Apr 1, 2008
- Spansion LLC
- Katsutoshi Suitou
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reference cell adjusting in a storage device
- Patent number 7,239,553
- Issue date Jul 3, 2007
- Spansion LLC
- Katsutoshi Suitou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,418,072
- Issue date Jul 9, 2002
- Fujitsu Limited
- Yoshichika Nakaya
- G11 - INFORMATION STORAGE
Information Patent Grant
Bipolar random access memory
- Patent number 5,083,292
- Issue date Jan 21, 1992
- Fujitsu Limited
- Katsuyuki Yamada
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for testing a memory device
- Publication number 20060242490
- Publication date Oct 26, 2006
- Katsutoshi Suitou
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for reference cell adjusting in a storage device
- Publication number 20060233028
- Publication date Oct 19, 2006
- Katsutoshi Suitou
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit
- Publication number 20010010651
- Publication date Aug 2, 2001
- FUJITSU LIMITED
- Yoshichika Nakaya
- G11 - INFORMATION STORAGE