Yoshie OTAKE

Person

Wako-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Target structure and target device
- Patent number 11,985,755
- Issue date May 14, 2024
- Riken
- Tomohiro Kobayashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Nondestructive inspection method and apparatus comprising a neutron...
- Patent number 11,841,335
- Issue date Dec 12, 2023
- Riken
- Yasuo Wakabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive test system comprising a neutron emission unit for e...
- Patent number 11,754,516
- Issue date Sep 12, 2023
- Topcon Corporation
- Hisashi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
- Patent number 11,747,288
- Issue date Sep 5, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive testing system and nondestructive testing method
- Patent number 11,614,415
- Issue date Mar 28, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection method
- Patent number 11,609,190
- Issue date Mar 21, 2023
- Topcon Corporation
- Yuichi Yoshimura
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspecting system, and nondestructive inspecting method
- Patent number 11,513,084
- Issue date Nov 29, 2022
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for acquiring tomographic image data by oversampl...
- Patent number 11,307,153
- Issue date Apr 19, 2022
- Riken
- Takaoki Takanashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive inspection device and method
- Patent number 10,241,061
- Issue date Mar 26, 2019
- Riken
- Yoshie Otake
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD
- Publication number 20250027890
- Publication date Jan 23, 2025
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
Non-Destructive Inspection Device
- Publication number 20240295511
- Publication date Sep 5, 2024
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20240192153
- Publication date Jun 13, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
- Publication number 20240183801
- Publication date Jun 6, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
System, Method, and Program for Tomographic Imaging, and Recording...
- Publication number 20240153162
- Publication date May 9, 2024
- Riken
- Takaoki Takanashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20230393082
- Publication date Dec 7, 2023
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
CABLE INSPECTION DEVICE AND CABLE INSPECTION METHOD
- Publication number 20230213462
- Publication date Jul 6, 2023
- Riken
- Yoshie OTAKE
- G01 - MEASURING TESTING
Information Patent Application
CONCENTRATION DETECTION DEVICE AND CONCENTRATION DETECTION METHOD
- Publication number 20230152250
- Publication date May 18, 2023
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE TEST SYSTEM AND NONDESTRUCTIVE TEST METHOD
- Publication number 20220128489
- Publication date Apr 28, 2022
- TOPCON CORPORATION
- Hisashi TSUKADA
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD
- Publication number 20220082514
- Publication date Mar 17, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20220003690
- Publication date Jan 6, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...
- Publication number 20210396688
- Publication date Dec 23, 2021
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ACQUIRING TOMOGRAPHIC IMAGE DATA BY OVERSAMPL...
- Publication number 20210262947
- Publication date Aug 26, 2021
- Riken
- Takaoki TAKANASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TARGET STRUCTURE AND TARGET DEVICE
- Publication number 20210168925
- Publication date Jun 3, 2021
- Riken
- Tomohiro KOBAYASHI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NON-DESTRUCTIVE INSPECTION METHOD
- Publication number 20210131981
- Publication date May 6, 2021
- TOPCON CORPORATION
- Yuichi YOSHIMURA
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS
- Publication number 20210033542
- Publication date Feb 4, 2021
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND METHOD
- Publication number 20180259462
- Publication date Sep 13, 2018
- Riken
- Yoshie OTAKE
- G01 - MEASURING TESTING

Yoshie OTAKE

Person

Patents Grantslast 30 patents

Target structure and target device

Nondestructive inspection method and apparatus comprising a neutron...

Nondestructive test system comprising a neutron emission unit for e...

Non-destructive inspection system comprising neutron radiation sour...

Nondestructive testing system and nondestructive testing method

Non-destructive inspection method

Nondestructive inspecting system, and nondestructive inspecting method

Method and device for acquiring tomographic image data by oversampl...

Non-destructive inspection device and method

Patents Applicationslast 30 patents

OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD

Non-Destructive Inspection Device

NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...

NONDESTRUCTIVE INSPECTION SYSTEM

NONDESTRUCTIVE INSPECTING DEVICE

System, Method, and Program for Tomographic Imaging, and Recording...

NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD

CABLE INSPECTION DEVICE AND CABLE INSPECTION METHOD

CONCENTRATION DETECTION DEVICE AND CONCENTRATION DETECTION METHOD

NONDESTRUCTIVE TEST SYSTEM AND NONDESTRUCTIVE TEST METHOD

NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD

NONDESTRUCTIVE INSPECTING SYSTEM, AND NONDESTRUCTIVE INSPECTING METHOD

NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...

METHOD AND DEVICE FOR ACQUIRING TOMOGRAPHIC IMAGE DATA BY OVERSAMPL...

TARGET STRUCTURE AND TARGET DEVICE

NON-DESTRUCTIVE INSPECTION METHOD

NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS

NON-DESTRUCTIVE INSPECTION DEVICE AND METHOD