Yoshifumi Tahara

Follow

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 7,209,851
- Issue date Apr 24, 2007
- Advantest America R&D Center, Inc.
- Harsanjeet Singh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20050154550
- Publication date Jul 14, 2005
- Advantest America R&D Center, Inc.
- Harsanjeet Singh
- G01 - MEASURING TESTING