Yoshifumi Taniguchi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and imaging method
- Patent number 10,535,497
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,679,738
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Hiroaki Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder for electron microscope
- Patent number 9,558,910
- Issue date Jan 31, 2017
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope apparatus comprising electron spec...
- Patent number 8,530,858
- Issue date Sep 10, 2013
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope having electron spectrometer
- Patent number 8,436,301
- Issue date May 7, 2013
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope having electron spectroscope
- Patent number 8,263,936
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number D636005
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D16 - Photography and optical equipment
Information Patent Grant
Charged particle beam apparatus and specimen holder
- Patent number 7,812,310
- Issue date Oct 12, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope provided with electronic spectroscope
- Patent number 7,723,682
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Standard specimen for a charged particle beam apparatus, specimen p...
- Patent number 7,622,714
- Issue date Nov 24, 2009
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the physical properties of micro...
- Patent number 7,385,198
- Issue date Jun 10, 2008
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and specimen holder
- Patent number 7,381,968
- Issue date Jun 3, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and image observation method using it
- Patent number 7,235,784
- Issue date Jun 26, 2007
- Hitachi High-Technologies Corporation
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring physical properties of micro region
- Patent number 7,022,988
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Material characterization system
- Patent number 6,992,286
- Issue date Jan 31, 2006
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,930,306
- Issue date Aug 16, 2005
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing element distribution
- Patent number 6,855,927
- Issue date Feb 15, 2005
- Hitachi High-Technologies Corporation
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Observation apparatus and observation method using an electron beam
- Patent number 6,750,451
- Issue date Jun 15, 2004
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter and electron microscope equipped with the energy filter
- Patent number 6,150,657
- Issue date Nov 21, 2000
- Hitachi, Ltd.
- Koji Kimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy filter
- Patent number 6,066,852
- Issue date May 23, 2000
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of observing element di...
- Patent number 5,981,948
- Issue date Nov 9, 1999
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy filter and transmission electron microscope provide...
- Patent number 5,585,630
- Issue date Dec 17, 1996
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of observing element di...
- Patent number 5,578,823
- Issue date Nov 26, 1996
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE AND IMAGING METHOD
- Publication number 20190131107
- Publication date May 2, 2019
- Hitachi High-Technologies Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20160196952
- Publication date Jul 7, 2016
- HIitachi High-Technologies Corporation
- Hiroaki MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPE
- Publication number 20140353499
- Publication date Dec 4, 2014
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROMETER
- Publication number 20110240854
- Publication date Oct 6, 2011
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROSCOPE
- Publication number 20090242766
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- Shohei TERADA
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and specimen holder
- Publication number 20080315097
- Publication date Dec 25, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope Provided with Electronic Spectroscope
- Publication number 20080203296
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Shohei TERADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Standard specimen for a charged particle beam apparatus, specimen p...
- Publication number 20080073521
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring the physical properties of micro...
- Publication number 20060113473
- Publication date Jun 1, 2006
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscope and image observation method using it
- Publication number 20060076492
- Publication date Apr 13, 2006
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and specimen holder
- Publication number 20050230636
- Publication date Oct 20, 2005
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20040188613
- Publication date Sep 30, 2004
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material characterization system
- Publication number 20040183012
- Publication date Sep 23, 2004
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring physical properties of micro region
- Publication number 20040061053
- Publication date Apr 1, 2004
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for observing element distribution
- Publication number 20040000641
- Publication date Jan 1, 2004
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Observation apparatus and observation method using an electron beam
- Publication number 20030006373
- Publication date Jan 9, 2003
- HITACHI LTD.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS

Yoshifumi Taniguchi

Person

Patents Grantslast 30 patents

Charged particle beam device for moving an aperture having pluralit...

Electron microscope and imaging method

Electron microscope

Sample holder for electron microscope

Transmission electron microscope apparatus comprising electron spec...

Transmission electron microscope having electron spectrometer

Transmission electron microscope having electron spectroscope

Electron microscope

Charged particle beam apparatus and specimen holder

Transmission electron microscope provided with electronic spectroscope

Standard specimen for a charged particle beam apparatus, specimen p...

Method and apparatus for measuring the physical properties of micro...

Charged particle beam apparatus and specimen holder

Transmission electron microscope and image observation method using it

Method and apparatus for measuring physical properties of micro region

Material characterization system

Electron microscope

Method and apparatus for observing element distribution

Observation apparatus and observation method using an electron beam

Energy filter and electron microscope equipped with the energy filter

Electron energy filter

Transmission electron microscope and method of observing element di...

Electron energy filter and transmission electron microscope provide...

Transmission electron microscope and method of observing element di...

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE AND IMAGING METHOD

Charged Particle Beam Device and Sample Observation Method

Electron Microscope

SAMPLE HOLDER FOR ELECTRON MICROSCOPE

TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROMETER

TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROSCOPE

Charged particle beam apparatus and specimen holder

Transmission Electron Microscope Provided with Electronic Spectroscope

Standard specimen for a charged particle beam apparatus, specimen p...

Method and apparatus for measuring the physical properties of micro...

Transmission electron microscope and image observation method using it

Charged particle beam apparatus and specimen holder

Electron microscope

Material characterization system

Method and apparatus for measuring physical properties of micro region

Method and apparatus for observing element distribution

Observation apparatus and observation method using an electron beam