Yoshiharu Abe

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Hitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current flaw detection sensor and method
- Patent number 7,358,721
- Issue date Apr 15, 2008
- Hitachi, Ltd.
- Soshi Narishige
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EDDY CURRENT TESTING METHOD AND EDDY CURRENT TESTING APPARATUS
- Publication number 20090102473
- Publication date Apr 23, 2009
- Soshi NARISHIGE
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION SENSOR AND METHOD
- Publication number 20070229066
- Publication date Oct 4, 2007
- Soshi Narishige
- G01 - MEASURING TESTING