Yoshiharu Ikeda

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Tokorozawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, testing and manufacturing methods thereof
- Patent number 7,668,027
- Issue date Feb 23, 2010
- Renesas Technology Corp.
- Kengo Imagawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device, testing and manufacturing methods thereof
- Publication number 20070047345
- Publication date Mar 1, 2007
- Kengo Imagawa
- G11 - INFORMATION STORAGE