Yoshiharu Shigyo

Follow

Person

Takasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for analyzing the state of generation of forei...
- Patent number 7,177,020
- Issue date Feb 13, 2007
- Renesas Technology Corp.
- Hiroshi Morioka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing the state of generation of forei...
- Patent number 6,894,773
- Issue date May 17, 2005
- Renesas Technology Corp.
- Hiroshi Morioka
- G01 - MEASURING TESTING
Information Patent Grant
Process management system
- Patent number 6,757,621
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device producing method, system for carrying out the...
- Patent number 6,650,409
- Issue date Nov 18, 2003
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Process control system
- Patent number 6,542,830
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing the state of generation of forei...
- Patent number 5,463,459
- Issue date Oct 31, 1995
- Hitachi, Ltd.
- Hiroshi Morioka
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for analyzing the state of generation of forei...
- Publication number 20050206887
- Publication date Sep 22, 2005
- Hiroshi Morioka
- G01 - MEASURING TESTING
Information Patent Application
Process management system
- Publication number 20030130806
- Publication date Jul 10, 2003
- Hitachi, Ltd
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for analyzing the state of generation of forei...
- Publication number 20010021015
- Publication date Sep 13, 2001
- Hiroshi Morioka
- B82 - NANO-TECHNOLOGY