Yoshiharu Sugano

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electrical property evaluation apparatus
- Patent number 7,187,166
- Issue date Mar 6, 2007
- SII NanoTechnology Inc.
- Yoshiharu Sugano
- G01 - MEASURING TESTING
Information Patent Grant
Thermomechanical analyzer equipped with a thermogravimetry function
- Patent number 5,826,983
- Issue date Oct 27, 1998
- Seiko Instruments Inc.
- Nobutaka Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for thermogravimetry
- Patent number 5,306,087
- Issue date Apr 26, 1994
- Seiko Instruments Inc.
- Nobutaka Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Thermogravimetric apparatus
- Patent number 5,215,377
- Issue date Jun 1, 1993
- Seiko Instruments Inc.
- Yoshiharu Sugano
- G01 - MEASURING TESTING