Yoshiharu Tanaka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring bromate ions
- Patent number 9,023,654
- Issue date May 5, 2015
- Metawater Co., Ltd.
- Natsumi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Bromate ion measurement method
- Patent number 8,778,691
- Issue date Jul 15, 2014
- Meta Water Co., Ltd.
- Shukuro Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus inspecting bonding-wire status using a plurali...
- Patent number 5,621,218
- Issue date Apr 15, 1997
- NEC Corporation
- Yoshiharu Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method of alignment between mask and semiconductor wafer
- Patent number 4,815,854
- Issue date Mar 28, 1989
- NEC Corporation
- Yoshiharu Tanaka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING BROMATE IONS
- Publication number 20140113381
- Publication date Apr 24, 2014
- Metawater Co., Ltd.
- Natsumi KONISHI
- G01 - MEASURING TESTING
Information Patent Application
BROMATE ION MEASUREMENT METHOD
- Publication number 20120329165
- Publication date Dec 27, 2012
- Ibaraki University
- Shukuro Igarashi
- G01 - MEASURING TESTING
Information Patent Application
BROMATE ION MEASUREMENT METHOD AND APPARATUS
- Publication number 20100330694
- Publication date Dec 30, 2010
- Shukuro Igarashi
- G01 - MEASURING TESTING