Yoshiharu UMEMURA

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing probe having boards connected by magnets
- Patent number 8,779,791
- Issue date Jul 15, 2014
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Probe, electronic device test apparatus, and method of producing th...
- Patent number 8,598,902
- Issue date Dec 3, 2013
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Wafer tray and test apparatus
- Patent number 8,513,962
- Issue date Aug 20, 2013
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe wafer, probe device, and testing system
- Patent number 8,427,187
- Issue date Apr 23, 2013
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Test system and probe apparatus
- Patent number 8,410,807
- Issue date Apr 2, 2013
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Test wafer unit and test system
- Patent number 8,289,040
- Issue date Oct 16, 2012
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Probe wafer, probe device, and testing system
- Patent number 8,134,379
- Issue date Mar 13, 2012
- Advantest Corporation
- Yoshio Komoto
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for testing a device under test and comparator ci...
- Patent number 7,389,190
- Issue date Jun 17, 2008
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation circuit and testing apparatus
- Patent number 7,342,407
- Issue date Mar 11, 2008
- Advantest Corporation
- Yuji Kuwana
- G01 - MEASURING TESTING
Information Patent Grant
Sampling circuit
- Patent number 7,208,982
- Issue date Apr 24, 2007
- Advantest Corporation
- Masahiro Yamakawa
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
PROBE AND METHOD OF MANUFACTURING SAME
- Publication number 20120038382
- Publication date Feb 16, 2012
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Application
PROBE, ELECTRONIC DEVICE TEST APPARATUS, AND METHOD OF PRODUCING TH...
- Publication number 20110121847
- Publication date May 26, 2011
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Application
PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM
- Publication number 20110121848
- Publication date May 26, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM
- Publication number 20110109337
- Publication date May 12, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST WAFER UNIT AND TEST SYSTEM
- Publication number 20110095777
- Publication date Apr 28, 2011
- Advantest Corporation
- Yoshio KOMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND PROBE APPARATUS
- Publication number 20110062979
- Publication date Mar 17, 2011
- Advantest Corporation
- Yoshiharu UMEMURA
- G01 - MEASURING TESTING
Information Patent Application
WAFER TRAY AND TEST APPARATUS
- Publication number 20110043237
- Publication date Feb 24, 2011
- Advantest Corporation
- Toshiyuki KIYOKAWA
- G01 - MEASURING TESTING
Information Patent Application
Temperature compensation circuit and testing apparatus
- Publication number 20070176617
- Publication date Aug 2, 2007
- Advantest Corporation
- Yuji Kuwana
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Calibration comparator circuit
- Publication number 20060267637
- Publication date Nov 30, 2006
- Advantest Corporation
- Yoshiharu Umemura
- G01 - MEASURING TESTING
Information Patent Application
Sampling circuit
- Publication number 20060097898
- Publication date May 11, 2006
- Advantest Corporation
- Masahiro Yamakawa
- H03 - BASIC ELECTRONIC CIRCUITRY

Yoshiharu UMEMURA

Person

Patents Grantslast 30 patents

Method of manufacturing probe having boards connected by magnets

Probe, electronic device test apparatus, and method of producing th...

Wafer tray and test apparatus

Probe wafer, probe device, and testing system

Test system and probe apparatus

Test wafer unit and test system

Probe wafer, probe device, and testing system

Testing apparatus for testing a device under test and comparator ci...

Temperature compensation circuit and testing apparatus

Sampling circuit

Patents Applicationslast 30 patents

PROBE AND METHOD OF MANUFACTURING SAME

PROBE, ELECTRONIC DEVICE TEST APPARATUS, AND METHOD OF PRODUCING TH...

PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM

PROBE WAFER, PROBE DEVICE, AND TESTING SYSTEM

TEST WAFER UNIT AND TEST SYSTEM

TEST SYSTEM AND PROBE APPARATUS

WAFER TRAY AND TEST APPARATUS

Temperature compensation circuit and testing apparatus

Calibration comparator circuit

Sampling circuit