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Yoshiharu Yoshii
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Izumi-ku, Sendai-shi, Miyagi 981-3214, JP
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Patents Grants
last 30 patents
Information
Patent Grant
High-frequency magnetic field generating device
Patent number
12,248,049
Issue date
Mar 11, 2025
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
Patent number
12,140,648
Issue date
Nov 12, 2024
Kyocera Document Solutions, Inc.
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Excitation light irradiating apparatus and excitation light irradia...
Patent number
12,066,392
Issue date
Aug 20, 2024
Sumida Corporation
Masateru Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
Patent number
11,933,865
Issue date
Mar 19, 2024
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus and measurement method
Patent number
11,808,831
Issue date
Nov 7, 2023
SUMIDA CORPORATION
David Ernst Herbschleb
G01 - MEASURING TESTING
Information
Patent Grant
Excitation light irradiation device and excitation light irradiatio...
Patent number
11,754,793
Issue date
Sep 12, 2023
SUMIDA CORPORATION
Masateru Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Measurement device having a microwave generator in which a capacito...
Patent number
11,747,414
Issue date
Sep 5, 2023
SUMIDA CORPORATION
Yuki Takemura
G01 - MEASURING TESTING
Information
Patent Grant
High-frequency magnetic field generating device
Patent number
11,668,778
Issue date
Jun 6, 2023
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
Patent number
11,619,687
Issue date
Apr 4, 2023
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field source detecting apparatus and magnetic field source...
Patent number
11,543,467
Issue date
Jan 3, 2023
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Excitation light irradiation device and excitation light irradiatio...
Patent number
11,320,607
Issue date
May 3, 2022
SUMIDA CORPORATION
Masateru Hashimoto
G02 - OPTICS
Information
Patent Grant
Measurement device having a microwave generator in which a capacito...
Patent number
11,221,381
Issue date
Jan 11, 2022
SUMIDA CORPORATION
Yuki Takemura
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field source detecting apparatus and magnetic field source...
Patent number
11,067,646
Issue date
Jul 20, 2021
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Excitation light irradiation device and excitation light irradiatio...
Patent number
10,996,407
Issue date
May 4, 2021
SUMIDA CORPORATION
Masateru Hashimoto
G02 - OPTICS
Information
Patent Grant
Magnetic field measurement apparatus and magnetic field measurement...
Patent number
10,969,445
Issue date
Apr 6, 2021
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
High-frequency magnetic field generating device
Patent number
10,921,413
Issue date
Feb 16, 2021
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for detecting a diaphragm failure
Patent number
6,359,458
Issue date
Mar 19, 2002
Yoshiharu Yoshii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NUCLEAR MAGNETIC RESONANCE SENSING DEVICE AND NUCLEAR MAGNETIC RESO...
Publication number
20250004076
Publication date
Jan 2, 2025
Izuru OHKI
G01 - MEASURING TESTING
Information
Patent Application
DIGITIZING DEVICE AND DIGITIZING METHOD
Publication number
20240418809
Publication date
Dec 19, 2024
Sumida Corporation
Yoshiharu YOSHII
B82 - NANO-TECHNOLOGY
Information
Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Publication number
20240410843
Publication date
Dec 12, 2024
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
Publication number
20240255594
Publication date
Aug 1, 2024
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
Publication number
20240255588
Publication date
Aug 1, 2024
Sumida Corporation
Shingo HAMADA
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20230258755
Publication date
Aug 17, 2023
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
EXCITATION LIGHT IRRADIATING APPARATUS AND EXCITATION LIGHT IRRADIA...
Publication number
20230194448
Publication date
Jun 22, 2023
Sumida Corporation
Masateru HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
Publication number
20230184853
Publication date
Jun 15, 2023
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
Publication number
20230051777
Publication date
Feb 16, 2023
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20220373628
Publication date
Nov 24, 2022
Sumida Corporation
David Ernst HERBSCHLEB
G01 - MEASURING TESTING
Information
Patent Application
EXCITATION LIGHT IRRADIATION DEVICE AND EXCITATION LIGHT IRRADIATIO...
Publication number
20220229246
Publication date
Jul 21, 2022
Sumida Corporation
Masateru HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
Measurement Device Having a Microwave Generator in which a Capacito...
Publication number
20220091201
Publication date
Mar 24, 2022
Sumida Corporation
Yuki TAKEMURA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SOURCE DETECTING APPARATUS AND MAGNETIC FIELD SOURCE...
Publication number
20210311134
Publication date
Oct 7, 2021
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
Excitation Light Irradiation Device And Excitation Light Irradiatio...
Publication number
20210223488
Publication date
Jul 22, 2021
Sumida Corporation
Masateru HASHIMOTO
G02 - OPTICS
Information
Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20210199744
Publication date
Jul 1, 2021
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
Publication number
20210190883
Publication date
Jun 24, 2021
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE
Publication number
20200271735
Publication date
Aug 27, 2020
Sumida Corporation
Yuki TAKEMURA
G01 - MEASURING TESTING
Information
Patent Application
EXCITATION LIGHT IRRADIATION DEVICE AND EXCITATION LIGHT IRRADIATIO...
Publication number
20200209493
Publication date
Jul 2, 2020
Sumida Corporation
Masateru HASHIMOTO
G02 - OPTICS
Information
Patent Application
MAGNETIC FIELD SOURCE DETECTING APPARATUS AND MAGNETIC FIELD SOURCE...
Publication number
20200132785
Publication date
Apr 30, 2020
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
Publication number
20200011939
Publication date
Jan 9, 2020
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20190079157
Publication date
Mar 14, 2019
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING