Yoshihata YANASE

Follow

Person

Hadano-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of analyzing nitride semiconductor layer and method of manuf...
- Patent number 9,086,321
- Issue date Jul 21, 2015
- Covalent Materials Corporation
- Yoshihata Yanase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING NITRIDE SEMICONDUCTOR LAYER AND METHOD OF MANUF...
- Publication number 20140055783
- Publication date Feb 27, 2014
- Covalent Materials Corporation
- Yoshihata YANASE
- G01 - MEASURING TESTING