Yoshihide OTA

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus
- Patent number 10,545,101
- Issue date Jan 28, 2020
- Omron Corporation
- Shinji Sugita
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Examination method, examination apparatus and examination program
- Patent number 8,509,512
- Issue date Aug 13, 2013
- Omron Corporation
- Yoshihide Ota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS
- Publication number 20170356860
- Publication date Dec 14, 2017
- Omron Corporation
- Shinji SUGITA
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION METHOD, EXAMINATION APPARATUS AND EXAMINATION PROGRAM
- Publication number 20100172561
- Publication date Jul 8, 2010
- OMRON CORPORATION
- Yoshihide OTA
- G06 - COMPUTING CALCULATING COUNTING