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Yoshihide Tanaka
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Osaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electrophoresis chip, electrophoresis apparatus, and method for ana...
Patent number
9,494,553
Issue date
Nov 15, 2016
National Institute of Advanced Industrial Science and Technology
Yoshihide Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Process for analyzing sample by capillary electrophoresis method
Patent number
9,121,821
Issue date
Sep 1, 2015
National Institute of Advanced Industrial Science and Technology
Yoshihide Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Process for analyzing sample by capillary electrophoresis method
Patent number
8,137,512
Issue date
Mar 20, 2012
National Institute of Advanced Industrial Science and Technology
Yoshihide Tanaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Process for Analyzing Sample by Capillary Electrophoresis Method
Publication number
20150219595
Publication date
Aug 6, 2015
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Yoshihide Tanaka
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD FOR CAPILLARY ELECTROPHORESIS
Publication number
20100258440
Publication date
Oct 14, 2010
ARKRAY, Inc.
Koji Sugiyama
C07 - ORGANIC CHEMISTRY
Information
Patent Application
PROCESS FOR ANALYZING SAMPLE BY CAPILLARY ELECTROPHORESIS METHOD
Publication number
20100187110
Publication date
Jul 29, 2010
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Yoshihide Tanaka
G01 - MEASURING TESTING
Information
Patent Application
PROCESS FOR ANALYZING SAMPLE BY CAPILLARY ELECTROPHORESIS METHOD
Publication number
20100175996
Publication date
Jul 15, 2010
ARKRAY, Inc.
Yoshihide Tanaka
G01 - MEASURING TESTING
Information
Patent Application
Method of Analyzing a Sample by Capillary Electrophoresis
Publication number
20100155242
Publication date
Jun 24, 2010
ARKRAY, Inc.
Yusuke Nakayama
C07 - ORGANIC CHEMISTRY
Information
Patent Application
Electrophoresis Chip, Electrophoresis Apparatus, and Method for Ana...
Publication number
20100116660
Publication date
May 13, 2010
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Yoshihide Tanaka
G01 - MEASURING TESTING