Yoshihiko FUJIMORI

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting substrate, substrate inspection apparatus, ex...
- Patent number 10,460,998
- Issue date Oct 29, 2019
- Nikon Corporation
- Yoshihiko Fujimori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus, inspection method, exposure method, and metho...
- Patent number 10,352,875
- Issue date Jul 16, 2019
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus, method for inspecting surface, exposu...
- Patent number 9,322,788
- Issue date Apr 26, 2016
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus, method for inspecting surface, exposu...
- Patent number 9,240,356
- Issue date Jan 19, 2016
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus, method for inspecting surface, exposu...
- Patent number 9,196,550
- Issue date Nov 24, 2015
- Nikon Corporation
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and surface inspection device
- Patent number 7,907,268
- Issue date Mar 15, 2011
- Nikon Corporation
- Yoshihiko Fujimori
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 5,046,109
- Issue date Sep 3, 1991
- Nikon Corporation
- Yoshihiko Fujimori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspecting apparatus
- Patent number 4,942,619
- Issue date Jul 17, 1990
- Nikon Corporation
- Makoto Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspecting apparatus
- Patent number 4,870,693
- Issue date Sep 26, 1989
- Nikon Corporation
- Tetsuyuki Arai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION APPARATUS, METHOD FOR INSPECTING SURFACE, EXPOSU...
- Publication number 20160041108
- Publication date Feb 11, 2016
- Nikon Corporation
- Kazuhiko FUKAZAWA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT METHOD, AND METHOD FOR MANUFACTURIN...
- Publication number 20140315330
- Publication date Oct 23, 2014
- Yoshihiko FUJIMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS, INSPECTION METHOD, EXPOSURE METHOD, AND METHO...
- Publication number 20130217154
- Publication date Aug 22, 2013
- Kazuhiko Fukazawa
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS, METHOD FOR INSPECTING SURFACE, EXPOSU...
- Publication number 20120164763
- Publication date Jun 28, 2012
- Kazuhiko FUKAZAWA
- G02 - OPTICS
Information Patent Application
METHOD FOR INSPECTING SUBSTRATE, SUBSTRATE INSPECTION APPARATUS, EX...
- Publication number 20120122252
- Publication date May 17, 2012
- Yoshihiko FUJIMORI
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Device
- Publication number 20100182603
- Publication date Jul 22, 2010
- Yoshihiko Fujimori
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION METHOD AND SURFACE INSPECTION DEVICE
- Publication number 20100177312
- Publication date Jul 15, 2010
- Yoshihiko Fujimori
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD FOR INSPECTION DEVICE
- Publication number 20090316978
- Publication date Dec 24, 2009
- Yoshihiko Fujimori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Surface inspection device
- Publication number 20090079983
- Publication date Mar 26, 2009
- NIKON CORPORATION
- Yoshihiko Fujimori
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection device
- Publication number 20090074285
- Publication date Mar 19, 2009
- NIKON CORPORATION
- Yoshihiko Fujimori
- G06 - COMPUTING CALCULATING COUNTING

Yoshihiko FUJIMORI

Person

Patents Grantslast 30 patents

Method for inspecting substrate, substrate inspection apparatus, ex...

Inspection apparatus, inspection method, exposure method, and metho...

Surface inspection apparatus, method for inspecting surface, exposu...

Surface inspection apparatus, method for inspecting surface, exposu...

Surface inspection apparatus, method for inspecting surface, exposu...

Surface inspection method and surface inspection device

Pattern inspection apparatus

Pattern inspecting apparatus

Mask inspecting apparatus

Patents Applicationslast 30 patents

SURFACE INSPECTION APPARATUS, METHOD FOR INSPECTING SURFACE, EXPOSU...

MEASUREMENT DEVICE, MEASUREMENT METHOD, AND METHOD FOR MANUFACTURIN...

INSPECTION APPARATUS, INSPECTION METHOD, EXPOSURE METHOD, AND METHO...

SURFACE INSPECTION APPARATUS, METHOD FOR INSPECTING SURFACE, EXPOSU...

METHOD FOR INSPECTING SUBSTRATE, SUBSTRATE INSPECTION APPARATUS, EX...

Surface Inspection Device

SURFACE INSPECTION METHOD AND SURFACE INSPECTION DEVICE

MANUFACTURING METHOD FOR INSPECTION DEVICE

Surface inspection device

Surface inspection device