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Yoshihiko Ino
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
8,659,151
Issue date
Feb 25, 2014
Lapis Semiconductor Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
8,207,020
Issue date
Jun 26, 2012
Lapis Semiconductor Co., Ltd.
Yoshihiko Ino
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Acceleration sensor
Patent number
8,042,392
Issue date
Oct 25, 2011
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing semiconductor device
Patent number
8,017,448
Issue date
Sep 13, 2011
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
7,939,931
Issue date
May 10, 2011
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Semiconductor device with double-sided electrode structure and its...
Patent number
7,884,466
Issue date
Feb 8, 2011
Oki Electric Industry Co., Ltd.
Masamichi Ishihara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Acceleration sensor
Patent number
7,650,787
Issue date
Jan 26, 2010
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor acceleration sensor device
Patent number
7,554,168
Issue date
Jun 30, 2009
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor acceleration sensor device and fabrication method the...
Patent number
7,513,154
Issue date
Apr 7, 2009
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method of semiconductor device
Patent number
7,078,270
Issue date
Jul 18, 2006
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of making semiconductor device
Patent number
6,815,260
Issue date
Nov 9, 2004
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of making same
Patent number
6,414,380
Issue date
Jul 2, 2002
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor device
Publication number
20110183468
Publication date
Jul 28, 2011
Yoshihiko Ino
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SEMICONDUCTOR DEVICE WITH DOUBLE-SIDED ELECTRODE STRUCTURE AND ITS...
Publication number
20110089551
Publication date
Apr 21, 2011
Oki Electric Industry Co., Ltd.
Masamichi ISHIHARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Acceleration sensor
Publication number
20100101325
Publication date
Apr 29, 2010
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Method for manufacturing semiconductor device
Publication number
20090263938
Publication date
Oct 22, 2009
Oki Semiconductor Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE WITH DOUBLE-SIDED ELECTRODE STRUCTURE AND ITS...
Publication number
20090072381
Publication date
Mar 19, 2009
Masamichi Ishihara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and manufacturing method thereof
Publication number
20080315415
Publication date
Dec 25, 2008
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device
Publication number
20080237830
Publication date
Oct 2, 2008
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Semiconductor apparatus and method of manufacturing same
Publication number
20080237839
Publication date
Oct 2, 2008
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor acceleration sensor
Publication number
20070277607
Publication date
Dec 6, 2007
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor acceleration sensor and fabrication method thereof
Publication number
20070144259
Publication date
Jun 28, 2007
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20070045787
Publication date
Mar 1, 2007
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor acceleration sensor device and fabrication method the...
Publication number
20060266117
Publication date
Nov 30, 2006
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Acceleration sensor
Publication number
20060196270
Publication date
Sep 7, 2006
Oki Electric Industry Co., Ltd.
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Package for semiconductor device
Publication number
20060131711
Publication date
Jun 22, 2006
Yoshihiko Ino
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device and manufacturing method of semiconductor device
Publication number
20050054142
Publication date
Mar 10, 2005
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of making semiconductor device
Publication number
20020142520
Publication date
Oct 3, 2002
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device and method of making same
Publication number
20020056895
Publication date
May 16, 2002
Yoshihiko Ino
H01 - BASIC ELECTRIC ELEMENTS