Yoshihiko Nakayama

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 8,766,184
- Issue date Jul 1, 2014
- Hitachi High-Technologies Corporation
- Haruhiko Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy
- Patent number 8,044,352
- Issue date Oct 25, 2011
- Hitachi High-Technologies Corporation
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and dimension measuring method
- Patent number 8,030,614
- Issue date Oct 4, 2011
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and dimension measuring method
- Patent number 7,973,282
- Issue date Jul 5, 2011
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming method and electron microscope
- Patent number 7,838,834
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and high-voltage discharge prevention method
- Patent number 7,274,017
- Issue date Sep 25, 2007
- Hitachi High-Technologies Corporation
- Akimitsu Okura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and dimension measuring method
- Patent number 7,214,936
- Issue date May 8, 2007
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and high-voltage discharge prevention method
- Patent number 6,949,752
- Issue date Sep 27, 2005
- Hitachi High-Technologies Corporation
- Akimitsu Okura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20130284923
- Publication date Oct 31, 2013
- Hitachi High-Technologies Corporation
- Haruhiko Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND DIMENSION MEASURING METHOD
- Publication number 20090314938
- Publication date Dec 24, 2009
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPY
- Publication number 20090242792
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- KOTARO HOSOYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Forming Method and Electron Microscope
- Publication number 20080224040
- Publication date Sep 18, 2008
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Charged Particle Beam Device
- Publication number 20080197282
- Publication date Aug 21, 2008
- Hitachi High-Technologies Corporation
- Yoshihiko Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and dimension measuring method
- Publication number 20080100832
- Publication date May 1, 2008
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and dimension measuring method
- Publication number 20060071166
- Publication date Apr 6, 2006
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and high-voltage discharge prevention method
- Publication number 20050218777
- Publication date Oct 6, 2005
- Akimitsu Okura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and high-voltage discharge prevention method
- Publication number 20030155525
- Publication date Aug 21, 2003
- Akimitsu Okura
- H01 - BASIC ELECTRIC ELEMENTS

Yoshihiko Nakayama

Person

Patents Grantslast 30 patents

Scanning electron microscope

Electron microscopy

Charged particle beam apparatus and dimension measuring method

Charged particle beam apparatus and dimension measuring method

Image forming method and electron microscope

Electron beam apparatus and high-voltage discharge prevention method

Charged particle beam apparatus and dimension measuring method

Electron beam apparatus and high-voltage discharge prevention method

Patents Applicationslast 30 patents

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM APPARATUS AND DIMENSION MEASURING METHOD

ELECTRON MICROSCOPY

Image Forming Method and Electron Microscope

Scanning Transmission Charged Particle Beam Device

Charged particle beam apparatus and dimension measuring method

Charged particle beam apparatus and dimension measuring method

Electron beam apparatus and high-voltage discharge prevention method

Electron beam apparatus and high-voltage discharge prevention method