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Yoshihiko Togawa
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Wako, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Interferometer
Patent number
7,872,755
Issue date
Jan 18, 2011
Riken
Ken Harada
G01 - MEASURING TESTING
Information
Patent Grant
Electron interferometer or electron microscope
Patent number
7,816,648
Issue date
Oct 19, 2010
Riken
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetization state control device and magnetic information recordi...
Patent number
7,808,814
Issue date
Oct 5, 2010
Riken
Yoshihiko Togawa
G11 - INFORMATION STORAGE
Information
Patent Grant
Interferometer having three electron biprisms
Patent number
7,750,298
Issue date
Jul 6, 2010
Riken
Ken Harada
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam equipment
Patent number
7,655,905
Issue date
Feb 2, 2010
Riken
Ken Harada
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer
Patent number
7,538,323
Issue date
May 26, 2009
Riken
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Interferometer
Publication number
20090273789
Publication date
Nov 5, 2009
Riken
Ken Harada
G02 - OPTICS
Information
Patent Application
Charged particle beam equipment
Publication number
20090045339
Publication date
Feb 19, 2009
Ken Harada
G01 - MEASURING TESTING
Information
Patent Application
Magnetization state control device and magnetic information recordi...
Publication number
20090021866
Publication date
Jan 22, 2009
Riken
Yoshihiko Togawa
G11 - INFORMATION STORAGE
Information
Patent Application
Electron Interferometer or Electron Microscope
Publication number
20080302965
Publication date
Dec 11, 2008
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interferometer
Publication number
20080258058
Publication date
Oct 23, 2008
Ken Harada
G02 - OPTICS
Information
Patent Application
Interferometer
Publication number
20070272861
Publication date
Nov 29, 2007
RIKEN
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS