Yoshihiro Abe

Follow

Person

Kariya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Antireflection structure and method of manufacturing the same
- Patent number 11,719,860
- Issue date Aug 8, 2023
- Denso Corporation
- Yoshihiro Abe
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Radar apparatus
- Patent number 9,097,796
- Issue date Aug 4, 2015
- Denso Corporation
- Akiyoshi Mizutani
- G01 - MEASURING TESTING
Information Patent Grant
Radar system
- Patent number 9,075,134
- Issue date Jul 7, 2015
- Denso Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Grant
Radar sensor for receiving radar wave while judging existence of wa...
- Patent number 7,755,534
- Issue date Jul 13, 2010
- Denso Corporation
- Yoshie Samukawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANTIREFLECTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20200271830
- Publication date Aug 27, 2020
- DENSO CORPORATION
- Yoshihiro ABE
- B60 - VEHICLES IN GENERAL
Information Patent Application
RADAR SYSTEM
- Publication number 20130147666
- Publication date Jun 13, 2013
- DENSO CORPORATION
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Application
FMCW RADAR APPARATUS HAVING PLURALITY OF PROCESSOR CORES USED FOR S...
- Publication number 20120119938
- Publication date May 17, 2012
- DENSO CORPORATION
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Application
RADAR APPARATUS
- Publication number 20120119939
- Publication date May 17, 2012
- DENSO CORPORATION
- Akiyoshi Mizutani
- G01 - MEASURING TESTING
Information Patent Application
Radar sensor for receiving radar wave while judging existence of wa...
- Publication number 20090207079
- Publication date Aug 20, 2009
- DENSO CORPORATION
- Yoshie Samukawa
- G01 - MEASURING TESTING
Information Patent Application
Device and method for estimating the number of arrival signals
- Publication number 20090021422
- Publication date Jan 22, 2009
- DENSO CORPORATION
- Yoshihiro Abe
- G01 - MEASURING TESTING