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Yoshihiro ABE
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Contactor, contact structure, probe card, and test apparatus
Patent number
8,241,929
Issue date
Aug 14, 2012
Advantest Corporation
Tetsuya Kuitani
G01 - MEASURING TESTING
Information
Patent Grant
Fixing apparatus for a probe card
Patent number
8,212,579
Issue date
Jul 3, 2012
Advantest Corporation
Yoshihiro Abe
G01 - MEASURING TESTING
Information
Patent Grant
Connection board, probe card, and electronic device test apparatus...
Patent number
8,134,381
Issue date
Mar 13, 2012
Advantest Corporation
Yoshihiro Abe
G01 - MEASURING TESTING
Information
Patent Grant
Method of production of a contact structure
Patent number
8,097,475
Issue date
Jan 17, 2012
Advantest Corporation
Tetsuya Kuitani
G01 - MEASURING TESTING
Information
Patent Grant
Contactor, contact structure provided with contactors, probe card,...
Patent number
7,764,152
Issue date
Jul 27, 2010
Advantest Corporation
Tetsuya Kuitani
G01 - MEASURING TESTING
Information
Patent Grant
Developing device for an image forming apparatus
Patent number
6,795,674
Issue date
Sep 21, 2004
Ricoh Company, Ltd.
Shuuichi Endoh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Developing device for an image forming apparatus
Patent number
6,643,486
Issue date
Nov 4, 2003
Ricoh Company, Ltd.
Shuuichi Endoh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Image density control method for an image forming apparatus
Patent number
5,028,960
Issue date
Jul 2, 1991
Ricoh Company, Ltd.
Wataru Yasuda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Transfer medium separating device
Patent number
4,412,732
Issue date
Nov 1, 1983
Ricoh Company, Ltd.
Yoshihiro Ogata
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Transfer sheet separating/conveying apparatus for use in electropho...
Patent number
4,389,112
Issue date
Jun 21, 1983
Ricoh Company, Ltd.
Yoshihiro Ogata
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
CONTACTOR, CONTACT STRUCTURE, PROBE CARD, AND TEST APPARATUS
Publication number
20120112781
Publication date
May 10, 2012
Advantest Corporation
Tetsuya KUITANI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PRODUCTION OF A CONTACT STRUCTURE
Publication number
20100304559
Publication date
Dec 2, 2010
Advantest Corporation
Tetsuya KUITANI
G01 - MEASURING TESTING
Information
Patent Application
FIXING APPARATUS FOR A PROBE CARD
Publication number
20100127726
Publication date
May 27, 2010
Advantest Corporation
Yoshihiro Abe
G01 - MEASURING TESTING
Information
Patent Application
CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS...
Publication number
20100102837
Publication date
Apr 29, 2010
Advantest Corporation
Yoshihiro Abe
G01 - MEASURING TESTING
Information
Patent Application
CONTACTOR, CONTACT STRUCTURE PROVIDED WITH CONTACTORS, PROBE CARD,...
Publication number
20070013390
Publication date
Jan 18, 2007
Advantest Corporation
Tetsuya KUITANI
G01 - MEASURING TESTING
Information
Patent Application
Developing device for an image forming apparatus
Publication number
20040071482
Publication date
Apr 15, 2004
Shuuichi Endoh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY