Membership
Tour
Register
Log in
Yoshihiro Akiyama
Follow
Person
Minato-ku, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for inspecting appearance of inspection piece
Patent number
7,751,611
Issue date
Jul 6, 2010
Saki Corporation
Yoshihiro Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of growth of compound semiconductor
Patent number
4,561,916
Issue date
Dec 31, 1985
Agency of Industrial Science and Technology
Masahiro Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Apparatus for inspecting appearance of inspection piece
Publication number
20060165274
Publication date
Jul 27, 2006
Yoshihiro Akiyama
G01 - MEASURING TESTING