Yoshihiro Anan

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substitution site measuring equipment and substitution site measuri...
- Patent number 10,627,354
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Yoshihiro Anan
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle-beam analysis device and analysis method
- Patent number 9,752,997
- Issue date Sep 5, 2017
- Hitachi, Ltd.
- Yoshihiro Anan
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic element and charged particle beam device using the same
- Patent number 9,601,308
- Issue date Mar 21, 2017
- Hitachi, Ltd.
- Yoshihiro Anan
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam analyzer and analysis method
- Patent number 8,481,932
- Issue date Jul 9, 2013
- Hitachi, Ltd.
- Yoshihiro Anan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Substitution Site Measuring Equipment and Substitution Site Measuri...
- Publication number 20190017948
- Publication date Jan 17, 2019
- Hitachi, Ltd.
- Yoshihiro ANAN
- G02 - OPTICS
Information Patent Application
CHARGED-PARTICLE-BEAM ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20170067838
- Publication date Mar 9, 2017
- Hitachi, Ltd
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ELEMENT AND CHARGED PARTICLE BEAM DEVICE USING THE SAME
- Publication number 20150318144
- Publication date Nov 5, 2015
- Hitachi, Ltd
- Yoshihiro ANAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM ANALYZER AND ANALYSIS METHOD
- Publication number 20120257720
- Publication date Oct 11, 2012
- Hitachi, Ltd.
- Yoshihiro ANAN
- H01 - BASIC ELECTRIC ELEMENTS