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Yoshihiro KABE

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 11,467,174
    • Issue date Oct 11, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro Kabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,402,397
    • Issue date Aug 2, 2022
    • Hitachi High-Technologies Corporation
    • Yoshihiro Kabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,215,629
    • Issue date Jan 4, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro Kabe
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20240230701
    • Publication date Jul 11, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Noritaka MINAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20240192244
    • Publication date Jun 13, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takuya TAKAHASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE ASPIRATION METHOD IN AUTOMATIC ANALYZER
    • Publication number 20240142487
    • Publication date May 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro KABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20240125812
    • Publication date Apr 18, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Kenshiro SAKATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220196695
    • Publication date Jun 23, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro KABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20200278364
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Yoshihiro KABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200033374
    • Publication date Jan 30, 2020
    • Hitachi High-Technologies Corporation
    • Yoshihiro KABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20190145997
    • Publication date May 16, 2019
    • Hitachi High-Technologies Corporation
    • Yoshihiro KABE
    • G01 - MEASURING TESTING