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Yoshihiro KIMURA

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  • Suginami-ku, Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 10,665,420
    • Issue date May 26, 2020
    • Hitachi High-Technologies Corporation
    • Yasunori Takasugi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Glucose production method and glucose produced by said method
    • Patent number 10,119,156
    • Issue date Nov 6, 2018
    • ACTEIIVE CORPORATION
    • Yoshihiro Kimura
    • C07 - ORGANIC CHEMISTRY
  • Information Patent Grant

    Charged particle radiation apparatus
    • Patent number 9,153,418
    • Issue date Oct 6, 2015
    • Hitachi High-Technologies Corporation
    • Fumihiro Sasajima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pattern measuring method, pattern measuring apparatus, and program...
    • Patent number 9,104,913
    • Issue date Aug 11, 2015
    • Hitachi High-Technologies Corporation
    • Fumihiro Sasajima
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Micro actuator
    • Patent number 8,097,986
    • Issue date Jan 17, 2012
    • THK Co., Ltd
    • Yoshihiro Kimura
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    Linear motor actuator
    • Patent number 8,067,862
    • Issue date Nov 29, 2011
    • THK Co., Ltd
    • Yoshihiro Kimura
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    XY table actuator
    • Patent number 8,047,095
    • Issue date Nov 1, 2011
    • THK Co., Ltd
    • Toshiyuki Aso
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    X-Y table actuator
    • Patent number 7,880,344
    • Issue date Feb 1, 2011
    • THK Co., Ltd
    • Yoshihiro Kimura
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    Charged particle beam adjusting method and charged particle beam ap...
    • Patent number 7,705,300
    • Issue date Apr 27, 2010
    • Hitachi High-Technologies Corporation
    • Hidetoshi Morokuma
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Pattern measuring method
    • Patent number 7,288,764
    • Issue date Oct 30, 2007
    • Hitachi High-Technologies Corporation
    • Fumihiro Sasajima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pattern measuring method
    • Patent number 7,180,062
    • Issue date Feb 20, 2007
    • Hitachi High-Technologies Corporation
    • Fumihiro Sasajima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Apparatus and method of ion beam processing
    • Patent number 6,610,987
    • Issue date Aug 26, 2003
    • Hitachi, Ltd.
    • Yoshihiro Kimura
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents