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Yoshihiro Murakami
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Mitaka, JP
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last 30 patents
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Patent Grant
Magnetic flaw detection apparatus using an E-shaped magnetic sensor...
Patent number
6,057,684
Issue date
May 2, 2000
Murakami; Yoshihiro
Yoshihiro Murakami
G01 - MEASURING TESTING
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Patent Grant
Saturable core magnetometer with a parallel resonant circuit in whi...
Patent number
5,287,059
Issue date
Feb 15, 1994
NKK Corporation
Seigo Ando
G01 - MEASURING TESTING