Yoshihiro Nishi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional survey apparatus, three-dimensional survey method...
- Patent number 11,692,823
- Issue date Jul 4, 2023
- Topcon Corporation
- Tadayuki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional survey apparatus, three-dimensional survey method...
- Patent number 10,895,456
- Issue date Jan 19, 2021
- Topcon Corporation
- Keisuke Nakamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BATTER BOARD INSTALLATION METHOD, BATTER BOARD INSTALLATION PROGRAM...
- Publication number 20230272632
- Publication date Aug 31, 2023
- TOPCON CORPORATION
- Yoshihiro NISHI
- E04 - BUILDING
Information Patent Application
BATTER BOARD PLACEMENT METHOD, BATTER BOARD PLACEMENT PROGRAM, AND...
- Publication number 20230272631
- Publication date Aug 31, 2023
- TOPCON CORPORATION
- Yoshihiro NISHI
- E04 - BUILDING
Information Patent Application
SURVEYING METHOD, SURVEYING SYSTEM, AND RECORDING MEDIUM STORING SU...
- Publication number 20230152095
- Publication date May 18, 2023
- TOPCON CORPORATION
- Kohei SATO
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE DISPLAY TERMINAL FOR SURVEY ASSISTANCE, SURVEY ASSISTANCE...
- Publication number 20230137777
- Publication date May 4, 2023
- TOPCON CORPORATION
- Keisuke NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TILT ANALYSIS METHOD, RECORDING MEDIUM STORING TILT ANALYSIS PROGRA...
- Publication number 20230069309
- Publication date Mar 2, 2023
- TOPCON CORPORATION
- Yoshihiro NISHI
- G01 - MEASURING TESTING
Information Patent Application
SURVEY METHOD, MOBILE TERMINAL, SURVEY SYSTEM, AND STORAGE MEDIUM
- Publication number 20230003527
- Publication date Jan 5, 2023
- TOPCON CORPORATION
- Umihiro ICHIRIYAMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...
- Publication number 20210080256
- Publication date Mar 18, 2021
- TOPCON CORPORATION
- Tadayuki ITO
- G02 - OPTICS
Information Patent Application
THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...
- Publication number 20210080577
- Publication date Mar 18, 2021
- TOPCON CORPORATION
- Tadayuki ITO
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...
- Publication number 20210018316
- Publication date Jan 21, 2021
- TOPCON CORPORATION
- Keisuke NAKAMURA
- G01 - MEASURING TESTING

Yoshihiro Nishi

Person

Patents Grantslast 30 patents

Three-dimensional survey apparatus, three-dimensional survey method...

Three-dimensional survey apparatus, three-dimensional survey method...

Patents Applicationslast 30 patents

BATTER BOARD INSTALLATION METHOD, BATTER BOARD INSTALLATION PROGRAM...

BATTER BOARD PLACEMENT METHOD, BATTER BOARD PLACEMENT PROGRAM, AND...

SURVEYING METHOD, SURVEYING SYSTEM, AND RECORDING MEDIUM STORING SU...

PORTABLE DISPLAY TERMINAL FOR SURVEY ASSISTANCE, SURVEY ASSISTANCE...

TILT ANALYSIS METHOD, RECORDING MEDIUM STORING TILT ANALYSIS PROGRA...

SURVEY METHOD, MOBILE TERMINAL, SURVEY SYSTEM, AND STORAGE MEDIUM

THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...

THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...

THREE-DIMENSIONAL SURVEY APPARATUS, THREE-DIMENSIONAL SURVEY METHOD...