Yoshihiro Nishikawa

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Residual DC measurement device, residual DC measurement method, and...
- Patent number 11,670,204
- Issue date Jun 6, 2023
- Konica Minolta, Inc.
- Yoshihiro Nishikawa
- G02 - OPTICS
Information Patent Grant
Two-dimensional flicker measurement apparatus and two-dimensional f...
- Patent number 11,490,028
- Issue date Nov 1, 2022
- Konica Minolta, Inc.
- Yoshihiro Nishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
RESIDUAL DC MEASUREMENT DEVICE, RESIDUAL DC MEASUREMENT METHOD, AND...
- Publication number 20220189354
- Publication date Jun 16, 2022
- Konica Minolta, Inc.
- YOSHIHIRO NISHIKAWA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
TWO-DIMENSIONAL FLICKER MEASUREMENT APPARATUS AND TWO-DIMENSIONAL F...
- Publication number 20200252536
- Publication date Aug 6, 2020
- Konica Minolta, Inc.
- Yoshihiro NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE EVALUATION APPARATUS, LIGHT SOURCE EVALUATION SYSTEM,...
- Publication number 20120101774
- Publication date Apr 26, 2012
- Yoshihiro Nishikawa
- G01 - MEASURING TESTING