Yoshihiro Ohtsu

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope and sample observation method
- Patent number 8,586,922
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Transmission Electron Microscope and Sample Observation Method
- Publication number 20120235035
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS