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Yoshihiro Okuno
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Tokyo, JP
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last 30 patents
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Patent Grant
Apparatus for measuring a shape
Patent number
4,848,912
Issue date
Jul 18, 1989
NKK Corporation
Kazuo Sano
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE PERFORMING OPERATIONAL PROCESSING
Publication number
20100179976
Publication date
Jul 15, 2010
RENESAS TECHNOLOGY CORP.
Masakatsu ISHIZAKI
G06 - COMPUTING CALCULATING COUNTING