TREA

Yoshihiro Takata

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Ionizing device
    • Patent number 8,592,779
    • Issue date Nov 26, 2013
    • Hamamatsu Photonics K.K.
    • Shigeki Matsuura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas analyzer
    • Patent number 8,044,343
    • Issue date Oct 25, 2011
    • Rigaku Corporation
    • Tadashi Arii
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Temperature-programmed desorbed gas analyzing apparatus
    • Patent number 7,155,960
    • Issue date Jan 2, 2007
    • Rigaku Corporation
    • Tadashi Arii
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Evolved gas analyzing method and apparatus
    • Patent number 7,140,231
    • Issue date Nov 28, 2006
    • Rigaku Corporation
    • Tadashi Arii
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents