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YOSHIHISA MATOBA
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KANAGAWA, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Charge detection sensor and potential measurement system
Patent number
12,163,992
Issue date
Dec 10, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Jun Ogi
G01 - MEASURING TESTING
Information
Patent Grant
Charge detection sensor and potential measurement system
Patent number
11,754,610
Issue date
Sep 12, 2023
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Jun Ogi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CHARGE DETECTION SENSOR AND POTENTIAL MEASUREMENT SYSTEM
Publication number
20240036096
Publication date
Feb 1, 2024
Sony Semiconductor Solutions Corporation
JUN OGI
G01 - MEASURING TESTING
Information
Patent Application
POTENTIAL MEASUREMENT DEVICE
Publication number
20230003678
Publication date
Jan 5, 2023
Sony Semiconductor Solutions Corporation
YOSHIHISA MATOBA
G01 - MEASURING TESTING
Information
Patent Application
CHARGE DETECTION SENSOR AND POTENTIAL MEASUREMENT SYSTEM
Publication number
20200271710
Publication date
Aug 27, 2020
Sony Semiconductor Solutions Corporation
JUN OGI
G01 - MEASURING TESTING