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Yoshihisa Yamamoto
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Takatsuki, JP
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Patents Grants
last 30 patents
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Patent Grant
X-ray fluorescence spectrometer and control method for x-ray fluore...
Patent number
11,698,352
Issue date
Jul 11, 2023
Rigaku Corporation
Yoshihisa Yamamoto
G01 - MEASURING TESTING
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Patent Grant
Analyzing apparatus
Patent number
6,708,121
Issue date
Mar 16, 2004
Rigaku Industrial Corporation
Akira Arake
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND CONTROL METHOD FOR X-RAY FLUORE...
Publication number
20220349847
Publication date
Nov 3, 2022
Yoshihisa YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
Analyzing apparatus
Publication number
20020052695
Publication date
May 2, 2002
Akira Arake
G01 - MEASURING TESTING