Yoshihito Fukasawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing a bare-chip LSI mounting on a printed board
- Patent number 6,486,686
- Issue date Nov 26, 2002
- NEC Corporation
- Yoshihito Fukasawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device tester and method of testing semiconductor device
- Patent number 6,433,410
- Issue date Aug 13, 2002
- NEC Corporation
- Michinobu Tanioka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device tester and method of testing semiconductor device
- Publication number 20010033010
- Publication date Oct 25, 2001
- Michinobu Tanioka
- G01 - MEASURING TESTING