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Yoshihito KITABATAKE

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card
    • Patent number 9,075,083
    • Issue date Jul 7, 2015
    • Kabushiki Kaisha Nihon Micronics
    • Yoshihito Onuma
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD
    • Publication number 20130328585
    • Publication date Dec 12, 2013
    • Kabushiki Kaisha Nihon Micronics
    • Yoshihito ONUMA
    • G01 - MEASURING TESTING