Yoshihito Kobayashi

Person

Hino Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Chuck cleaner and cleaning method
- Patent number 11,084,069
- Issue date Aug 10, 2021
- Kioxia Corporation
- Yoshihito Kobayashi
- B08 - CLEANING
Information Patent Grant
Chuck cleaner and cleaning method
- Patent number 10,160,014
- Issue date Dec 25, 2018
- TOSHIBA MEMORY CORPORATION
- Yoshihito Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle chuck cleaner and reticle chuck cleaning method
- Patent number 9,808,841
- Issue date Nov 7, 2017
- TOSHIBA MEMORY CORPORATION
- Yoshihito Kobayashi
- B08 - CLEANING
Information Patent Grant
Electrostatic chuck cleaner, cleaning method, and exposure apparatus
- Patent number 9,599,909
- Issue date Mar 21, 2017
- Kabushiki Kaisha Toshiba
- Takashi Kamo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask cleaner and cleaning method
- Patent number 9,348,218
- Issue date May 24, 2016
- Kabushiki Kaisha Toshiba
- Yoshihito Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for manufacturing template and method for manufacturing semi...
- Patent number 8,663,895
- Issue date Mar 4, 2014
- Kabushiki Kaisha Toshiba
- Yoshihito Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Patterning method and method for manufacturing semiconductor device
- Patent number 8,551,393
- Issue date Oct 8, 2013
- Kabushiki Kaisha Toshiba
- Yoshihito Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electronic device test apparatus for successively testing electroni...
- Patent number 7,800,393
- Issue date Sep 21, 2010
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device test apparatus for successively testing electroni...
- Patent number 7,612,575
- Issue date Nov 3, 2009
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and a test tray for use in t...
- Patent number 6,856,128
- Issue date Feb 15, 2005
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic components and testing apparatus for e...
- Patent number 6,728,652
- Issue date Apr 27, 2004
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Tester for semiconductor devices and test tray used for the same
- Patent number 6,459,259
- Issue date Oct 1, 2002
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Electric device testing apparatus
- Patent number 6,445,203
- Issue date Sep 3, 2002
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Electric device testing apparatus and electric device testing method
- Patent number 6,437,593
- Issue date Aug 20, 2002
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,433,294
- Issue date Aug 13, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Device handler
- Patent number 6,406,246
- Issue date Jun 18, 2002
- Advantest Corporation
- Akihiko Itoh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,384,593
- Issue date May 7, 2002
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
IC pickup, IC carrier and IC testing apparatus using the same
- Patent number 6,384,360
- Issue date May 7, 2002
- Advantest Corporation
- Yoshiyuki Masuo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,320,398
- Issue date Nov 20, 2001
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
IC tray holder
- Patent number D431580
- Issue date Oct 3, 2000
- Advantest Corporation
- Akihiko Ito
- D15 - Machines not elsewhere specified
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,104,183
- Issue date Aug 15, 2000
- Advantest Corporation
- Yoshihito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Device transfer and reinspection method for IC handler
- Patent number 6,075,216
- Issue date Jun 13, 2000
- Advantest Corp.
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and semiconductor device tes...
- Patent number 6,066,822
- Issue date May 23, 2000
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Test tray positioning stopper mechanism for automatic handler
- Patent number 5,973,493
- Issue date Oct 26, 1999
- Advantest Corp.
- Hiroto Nakamura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of forming patterns for use in manufacturing electronic devices
- Patent number 5,814,432
- Issue date Sep 29, 1998
- Kabushiki Kaisha Toshiba
- Yoshihito Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device transfer apparatus and device reinspection method for IC han...
- Patent number 5,772,387
- Issue date Jun 30, 1998
- Advantest Corp.
- Hiroto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Pattern forming method including the formation of an acidic coating...
- Patent number RE35821
- Issue date Jun 9, 1998
- Kabushiki Kaisha Toshiba
- Hirokazu Niki
- 430 - Radiation imagery chemistry: process, composition, or product thereof
Information Patent Grant
IC carrier for use with an IC handler
- Patent number 5,635,832
- Issue date Jun 3, 1997
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Test tray positioning stopper mechanism for automatic handler
- Patent number 5,625,287
- Issue date Apr 29, 1997
- Advantest Corporation
- Hiroto Nakamura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for forming resist patterns
- Patent number 5,580,702
- Issue date Dec 3, 1996
- Kabushiki Kaisha Toshiba
- Rumiko Hayase
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
CHUCK CLEANER AND CLEANING METHOD
- Publication number 20190076888
- Publication date Mar 14, 2019
- Toshiba Memory Corporation
- Yoshihito KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC CHUCK CLEANER, CLEANING METHOD, AND EXPOSURE APPARATUS
- Publication number 20150261104
- Publication date Sep 17, 2015
- Kabushiki Kaisha Toshiba
- TAKASHI KAMO
- B08 - CLEANING
Information Patent Application
CHUCK CLEANER AND CLEANING METHOD
- Publication number 20150107621
- Publication date Apr 23, 2015
- Kabushiki Kaisha Toshiba
- Yoshihito Kobayashi
- B08 - CLEANING
Information Patent Application
RETICLE CHUCK CLEANER AND RETICLE CHUCK CLEANING METHOD
- Publication number 20140326278
- Publication date Nov 6, 2014
- Kabushiki Kaisha Toshiba
- Yoshihito Kobayashi
- B08 - CLEANING
Information Patent Application
SEALANT-ATTACHED TEMPLATE, METHOD FOR STORING TEMPLATE, TEMPLATE SE...
- Publication number 20130224324
- Publication date Aug 29, 2013
- Yoshihito KOBAYASHI
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
IMPRINT LITHOGRAPHY TEMPLATE, METHOD OF FABRICATING AN IMPRINT LITH...
- Publication number 20120244243
- Publication date Sep 27, 2012
- Yoshihito KOBAYASHI
- B82 - NANO-TECHNOLOGY
Information Patent Application
TEMPLATE, METHOD OF FORMING TEMPLATE, AND METHOD OF MANUFACTURING S...
- Publication number 20120112370
- Publication date May 10, 2012
- Yoshihito KOBAYASHI
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR MANUFACTURING TEMPLATE AND METHOD FOR MANUFACTURING SEMI...
- Publication number 20110068083
- Publication date Mar 24, 2011
- Yoshihito KOBAYASHI
- B82 - NANO-TECHNOLOGY
Information Patent Application
PATTERNING METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20110034012
- Publication date Feb 10, 2011
- Yoshihito KOBAYASHI
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SEMICONDUCTOR APPARATUS MANUFACTURING METHOD AND IMPRINT TEMPLATE
- Publication number 20100330807
- Publication date Dec 30, 2010
- Yoshihito KOBAYASHI
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRONIC DEVICE TEST APPARATUS FOR SUCCESSIVELY TESTING ELECTRONI...
- Publication number 20100148793
- Publication date Jun 17, 2010
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE TEST APPARATUS AND METHOD OF TESTING ELECTRONIC D...
- Publication number 20100147088
- Publication date Jun 17, 2010
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
Electronic Device Test Apparatus
- Publication number 20080038098
- Publication date Feb 14, 2008
- Advantest Corporation
- Akihiko Ito
- G01 - MEASURING TESTING
Information Patent Application
TESTER FOR SEMICONDUCTOR DEVICES AND TEST TRAY USED FOR THE SAME
- Publication number 20020135356
- Publication date Sep 26, 2002
- AKIHIKO ITO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and semiconductor device tes...
- Publication number 20020036161
- Publication date Mar 28, 2002
- Advantest Corporation
- Shin Nemoto
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device testing apparatus and a test tray for use in t...
- Publication number 20020011836
- Publication date Jan 31, 2002
- Akihiko Ito
- G01 - MEASURING TESTING

Yoshihito Kobayashi

Person

Patents Grantslast 30 patents

Chuck cleaner and cleaning method

Chuck cleaner and cleaning method

Reticle chuck cleaner and reticle chuck cleaning method

Electrostatic chuck cleaner, cleaning method, and exposure apparatus

Mask cleaner and cleaning method

Method for manufacturing template and method for manufacturing semi...

Patterning method and method for manufacturing semiconductor device

Electronic device test apparatus for successively testing electroni...

Electronic device test apparatus for successively testing electroni...

Semiconductor device testing apparatus and a test tray for use in t...

Method of testing electronic components and testing apparatus for e...

Tester for semiconductor devices and test tray used for the same

Electric device testing apparatus

Electric device testing apparatus and electric device testing method

Semiconductor device testing apparatus and semiconductor device tes...

Device handler

Semiconductor device testing apparatus

IC pickup, IC carrier and IC testing apparatus using the same

Semiconductor device testing apparatus

IC tray holder

Semiconductor device testing apparatus

Device transfer and reinspection method for IC handler

Semiconductor device testing apparatus and semiconductor device tes...

Test tray positioning stopper mechanism for automatic handler

Method of forming patterns for use in manufacturing electronic devices

Device transfer apparatus and device reinspection method for IC han...

Pattern forming method including the formation of an acidic coating...

IC carrier for use with an IC handler

Test tray positioning stopper mechanism for automatic handler

Method for forming resist patterns

Patents Applicationslast 30 patents

CHUCK CLEANER AND CLEANING METHOD

ELECTROSTATIC CHUCK CLEANER, CLEANING METHOD, AND EXPOSURE APPARATUS

CHUCK CLEANER AND CLEANING METHOD

RETICLE CHUCK CLEANER AND RETICLE CHUCK CLEANING METHOD

SEALANT-ATTACHED TEMPLATE, METHOD FOR STORING TEMPLATE, TEMPLATE SE...

IMPRINT LITHOGRAPHY TEMPLATE, METHOD OF FABRICATING AN IMPRINT LITH...

TEMPLATE, METHOD OF FORMING TEMPLATE, AND METHOD OF MANUFACTURING S...

METHOD FOR MANUFACTURING TEMPLATE AND METHOD FOR MANUFACTURING SEMI...

PATTERNING METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR APPARATUS MANUFACTURING METHOD AND IMPRINT TEMPLATE

ELECTRONIC DEVICE TEST APPARATUS FOR SUCCESSIVELY TESTING ELECTRONI...

ELECTRONIC DEVICE TEST APPARATUS AND METHOD OF TESTING ELECTRONIC D...

Electronic Device Test Apparatus

TESTER FOR SEMICONDUCTOR DEVICES AND TEST TRAY USED FOR THE SAME

Semiconductor device testing apparatus and semiconductor device tes...

Semiconductor device testing apparatus and a test tray for use in t...