Yoshihito MARUMO

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Nirasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting positions of electrode pads
- Patent number 7,991,219
- Issue date Aug 2, 2011
- Tokyo Electron Limited
- Yoshihito Marumo
- G01 - MEASURING TESTING
Information Patent Grant
Probe inspection apparatus
- Patent number 5,936,416
- Issue date Aug 10, 1999
- Tokyo Electron Limited
- Hideaki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe method and apparatus with improved probe contact
- Patent number 5,777,485
- Issue date Jul 7, 1998
- Tokyo Electron Limited
- Hideaki Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting electric characteristics of wafers and apparat...
- Patent number 5,124,931
- Issue date Jun 23, 1992
- Tokyo Electron Limited
- Masaaki Iwamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETECTING POSITIONS OF ELECTRODE PADS
- Publication number 20090010525
- Publication date Jan 8, 2009
- TOKYO ELECTRON LIMITED
- Yoshihito MARUMO
- G06 - COMPUTING CALCULATING COUNTING