Yoshihito ONUMA

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Patents Grantslast 30 patents

Information Patent Grant
Probe card and testing apparatus
- Patent number 9,110,098
- Issue date Aug 18, 2015
- Kabushiki Kaisha Nihon Micronics
- Katsushi Mikuni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 9,075,083
- Issue date Jul 7, 2015
- Kabushiki Kaisha Nihon Micronics
- Yoshihito Onuma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND TESTING APPARATUS
- Publication number 20140028341
- Publication date Jan 30, 2014
- Katsushi MIKUNI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20130328585
- Publication date Dec 12, 2013
- Kabushiki Kaisha Nihon Micronics
- Yoshihito ONUMA
- G01 - MEASURING TESTING