Yoshihumi Tahara

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and structure to develop a test program for semiconductor in...
- Patent number 8,255,198
- Issue date Aug 28, 2012
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Structure to Develop a Test Program for Semiconductor In...
- Publication number 20100192135
- Publication date Jul 29, 2010
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING
Information Patent Application
Method and structure to develop a test program for semiconductor in...
- Publication number 20040225459
- Publication date Nov 11, 2004
- Advantest Corporation
- Ramachandran Krishnaswamy
- G01 - MEASURING TESTING