Yoshihumi Taniguchi

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope with electron spectrometer
- Patent number 8,344,320
- Issue date Jan 1, 2013
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with electron spectrometer
- Patent number 7,888,641
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
- Publication number 20110095182
- Publication date Apr 28, 2011
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
- Publication number 20090045340
- Publication date Feb 19, 2009
- Shohei TERADA
- H01 - BASIC ELECTRIC ELEMENTS