Yoshijiro Ushio

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing apparatus, image processing method, recording meth...
- Patent number 8,791,989
- Issue date Jul 29, 2014
- Nikon Corporation
- Yoshijiro Ushio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image processing apparatus, image processing method, recording meth...
- Patent number 8,675,048
- Issue date Mar 18, 2014
- Nikon Corporation
- Yoshijiro Ushio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Treatment condition decision method, treatment condition decision s...
- Patent number 7,203,564
- Issue date Apr 10, 2007
- Nikon Corporation
- Tatsuya Senga
- B24 - GRINDING POLISHING
Information Patent Grant
Method and device for simulation, method and device for polishing,...
- Patent number 7,108,580
- Issue date Sep 19, 2006
- Nikon Corporation
- Yoshijiro Ushio
- B24 - GRINDING POLISHING
Information Patent Grant
Layer-thickness detection methods and apparatus for wafers and the...
- Patent number 7,052,920
- Issue date May 30, 2006
- Nikon Corporation
- Yoshijiro Ushio
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for monitoring polishing state, polishing devi...
- Patent number 6,679,756
- Issue date Jan 20, 2004
- Nikon Corporation
- Akira Ishikawa
- B24 - GRINDING POLISHING
Information Patent Grant
Layer-thickness detection methods and apparatus for wafers and the...
- Patent number 6,670,200
- Issue date Dec 30, 2003
- Nikon Corporation
- Yoshijiro Ushio
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and methods for detecting thickness of a patterned layer
- Patent number 6,489,624
- Issue date Dec 3, 2002
- Nikon Corporation
- Yoshijiro Ushio
- G01 - MEASURING TESTING
Information Patent Grant
Polishing body, polishing apparatus, polishing apparatus adjustment...
- Patent number 6,458,014
- Issue date Oct 1, 2002
- Nikon Corporation
- Akira Ihsikawa
- B24 - GRINDING POLISHING
Information Patent Grant
Layer-thickness detection methods and apparatus for wafers and the...
- Patent number 6,271,047
- Issue date Aug 7, 2001
- Nikon Corporation
- Yoshijiro Ushio
- B24 - GRINDING POLISHING
Information Patent Grant
Light absorption measurement apparatus and methods
- Patent number 6,108,096
- Issue date Aug 22, 2000
- Nikon Corporation
- Yoshijiro Ushio
- G01 - MEASURING TESTING
Information Patent Grant
Film inspection method
- Patent number 6,102,775
- Issue date Aug 15, 2000
- Nikon Corporation
- Yoshijiro Ushio
- B24 - GRINDING POLISHING
Information Patent Grant
Photographic recording apparatus
- Patent number 5,933,181
- Issue date Aug 3, 1999
- Futaba Denshi Kogyo K.K.
- Yukihiko Shimizu
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Apparatus for measuring optical absorption of sample and sample hol...
- Patent number 5,673,114
- Issue date Sep 30, 1997
- Nikon Corporation
- Yoshijiro Ushio
- G01 - MEASURING TESTING
Information Patent Grant
Circuit forming method and apparatus therefor
- Patent number 5,641,597
- Issue date Jun 24, 1997
- Nikon Corporation
- Yoshijiro Ushio
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrochromic device with specific resistances
- Patent number 5,148,306
- Issue date Sep 15, 1992
- Nikon Corporation
- Masayuki Yamada
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE DISPLAY APPARATUS AND IMAGE DISPLAY METHOD
- Publication number 20120194905
- Publication date Aug 2, 2012
- Nikon Corporation
- Yoshijiro USHIO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...
- Publication number 20110310097
- Publication date Dec 22, 2011
- Nikon Corporation
- Yoshijiro USHIO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...
- Publication number 20110273543
- Publication date Nov 10, 2011
- Nikon Corporation
- Yoshijiro USHIO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Treatment condition decision method, treatment condition decision s...
- Publication number 20050176348
- Publication date Aug 11, 2005
- NIKON CORPORATION
- Tatsuya Senga
- B24 - GRINDING POLISHING
Information Patent Application
Method and device for simulation, method and device for polishing,...
- Publication number 20040248411
- Publication date Dec 9, 2004
- NIKON CORPORATION
- Yoshijiro Ushio
- B24 - GRINDING POLISHING
Information Patent Application
Method and apparatus for monitoring polishing state, polishing devi...
- Publication number 20020127951
- Publication date Sep 12, 2002
- Akira Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Polishing body, polishing apparatus, polishing apparatus adjustment...
- Publication number 20020042243
- Publication date Apr 11, 2002
- Akira Ihsikawa
- B24 - GRINDING POLISHING
Information Patent Application
Layer-thickness detection methods and apparatus for wafers and the...
- Publication number 20020001862
- Publication date Jan 3, 2002
- NIKON CORPORATION
- Yoshijiro Ushio
- G01 - MEASURING TESTING
Information Patent Application
Layer-thickness detection methods and apparatus for wafers and the...
- Publication number 20010039064
- Publication date Nov 8, 2001
- NIKON CORPORATION
- Yoshijiro Ushio
- G01 - MEASURING TESTING

Yoshijiro Ushio

Person

Patents Grantslast 30 patents

Image processing apparatus, image processing method, recording meth...

Image processing apparatus, image processing method, recording meth...

Treatment condition decision method, treatment condition decision s...

Method and device for simulation, method and device for polishing,...

Layer-thickness detection methods and apparatus for wafers and the...

Method and apparatus for monitoring polishing state, polishing devi...

Layer-thickness detection methods and apparatus for wafers and the...

Apparatus and methods for detecting thickness of a patterned layer

Polishing body, polishing apparatus, polishing apparatus adjustment...

Layer-thickness detection methods and apparatus for wafers and the...

Light absorption measurement apparatus and methods

Film inspection method

Photographic recording apparatus

Apparatus for measuring optical absorption of sample and sample hol...

Circuit forming method and apparatus therefor

Electrochromic device with specific resistances

Patents Applicationslast 30 patents

IMAGE DISPLAY APPARATUS AND IMAGE DISPLAY METHOD

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, RECORDING METH...

Treatment condition decision method, treatment condition decision s...

Method and device for simulation, method and device for polishing,...

Method and apparatus for monitoring polishing state, polishing devi...

Polishing body, polishing apparatus, polishing apparatus adjustment...

Layer-thickness detection methods and apparatus for wafers and the...

Layer-thickness detection methods and apparatus for wafers and the...