Yoshikatsu Tokuda

Person

Tokyo-to, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Distance measuring device
- Patent number 11,555,898
- Issue date Jan 17, 2023
- Topcon Corporation
- Yoshikatsu Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device and distance measuring method
- Patent number 10,386,466
- Issue date Aug 20, 2019
- Topcon Corporation
- Yoshikatsu Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device and method for calibrating the same
- Patent number 10,371,803
- Issue date Aug 6, 2019
- Topcon Corporation
- Yoshikatsu Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Light-emitting device and distance measurement device
- Patent number 10,277,006
- Issue date Apr 30, 2019
- Topcon Corporation
- Suguru Miyagawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light emitting device
- Patent number 9,985,415
- Issue date May 29, 2018
- Kabushiki Kaisha Topcon
- Yoshikatsu Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting light emitting device
- Patent number 9,397,475
- Issue date Jul 19, 2016
- Kabushiki Kaisha Topcon
- Yoshiaki Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distance measuring apparatus and distance measuring method
- Patent number 8,610,880
- Issue date Dec 17, 2013
- Topcon Corporation
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Time lag measuring device, distance measuring apparatus and distanc...
- Patent number 7,945,821
- Issue date May 17, 2011
- Kabushiki Kaisha Topcon
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Time lag measuring device, distance measuring apparatus and distanc...
- Patent number 7,849,371
- Issue date Dec 7, 2010
- Kabushiki Kaisha Topcon
- Masahiro Ohishi
Information Patent Grant
Surveying instrument
- Patent number 7,626,686
- Issue date Dec 1, 2009
- Topcon Corporation
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Processing apparatus for pulsed signal and processing method for pu...
- Patent number 7,518,709
- Issue date Apr 14, 2009
- Kabushiki Kaisha Topcon
- Masahiro Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Light-wave rangefinder using a pulse method
- Patent number 6,665,055
- Issue date Dec 16, 2003
- Kabushiki Kaisha Topcon
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring apparatus
- Patent number 6,384,904
- Issue date May 7, 2002
- Kabushiki Kaisha Topcon
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Surveying system
- Patent number 5,995,233
- Issue date Nov 30, 1999
- Kabushiki Kaisha TOPCON
- Fumio Ohtomo
- G01 - MEASURING TESTING
Information Patent Grant
Surveying apparatus
- Patent number 5,751,408
- Issue date May 12, 1998
- Kabushiki Kaisha Topcon
- Fumio Ohtomo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER SCANNING APPARATUS, LASER SCANNING METHOD, AND LASER SCANNING...
- Publication number 20230080388
- Publication date Mar 16, 2023
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
LASER SCANNING APPARATUS, LASER SCANNING METHOD, AND LASER SCANNING...
- Publication number 20230081870
- Publication date Mar 16, 2023
- TOPCON CORPORATION
- Hideki MORITA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20200271762
- Publication date Aug 27, 2020
- TOPCON CORPORATION
- Yoshikatsu TOKUDA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING DEVICE AND DISTANCE MEASUREMENT DEVICE
- Publication number 20180109073
- Publication date Apr 19, 2018
- TOPCON CORPORATION
- Suguru MIYAGAWA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHOD
- Publication number 20170276772
- Publication date Sep 28, 2017
- TOPCON CORPORATION
- Yoshikatsu TOKUDA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE AND METHOD FOR CALIBRATING THE SAME
- Publication number 20170276773
- Publication date Sep 28, 2017
- TOPCON CORPORATION
- Yoshikatsu TOKUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ADJUSTING LIGHT EMITTING DEVICE
- Publication number 20160056609
- Publication date Feb 25, 2016
- KABUSHIKI KAISHA TOPCON
- Yoshiaki GOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT EMITTING DEVICE
- Publication number 20160056610
- Publication date Feb 25, 2016
- Kabushiki Kaisha TOPCON
- Yoshikatsu TOKUDA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING APPARATUS AND DISTANCE MEASURING METHOD
- Publication number 20110310377
- Publication date Dec 22, 2011
- TOPCON CORPORATION
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Application
Time lag measuring device, distance measuring apparatus and distanc...
- Publication number 20090235127
- Publication date Sep 17, 2009
- Kabushiki Kaisha TOPCON
- Masahiro Ohishi
- G04 - HOROLOGY
Information Patent Application
SURVEYING INSTRUMENT
- Publication number 20090046272
- Publication date Feb 19, 2009
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Application
Processing apparatus for pulsed signal and processing method for pu...
- Publication number 20050171712
- Publication date Aug 4, 2005
- Kabushiki Kaisha TOPCON
- Masahiro Oishi
- G01 - MEASURING TESTING
Information Patent Application
Light-wave rangefinder using a pulse method
- Publication number 20030142287
- Publication date Jul 31, 2003
- Masahiro Ohishi
- G01 - MEASURING TESTING

Yoshikatsu Tokuda

Person

Patents Grantslast 30 patents

Distance measuring device

Distance measuring device and distance measuring method

Distance measuring device and method for calibrating the same

Light-emitting device and distance measurement device

Light emitting device

Method for adjusting light emitting device

Distance measuring apparatus and distance measuring method

Time lag measuring device, distance measuring apparatus and distanc...

Time lag measuring device, distance measuring apparatus and distanc...

Surveying instrument

Processing apparatus for pulsed signal and processing method for pu...

Light-wave rangefinder using a pulse method

Distance measuring apparatus

Surveying system

Surveying apparatus

Patents Applicationslast 30 patents

LASER SCANNING APPARATUS, LASER SCANNING METHOD, AND LASER SCANNING...

LASER SCANNING APPARATUS, LASER SCANNING METHOD, AND LASER SCANNING...

DISTANCE MEASURING DEVICE

LIGHT-EMITTING DEVICE AND DISTANCE MEASUREMENT DEVICE

DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHOD

DISTANCE MEASURING DEVICE AND METHOD FOR CALIBRATING THE SAME

METHOD FOR ADJUSTING LIGHT EMITTING DEVICE

LIGHT EMITTING DEVICE

DISTANCE MEASURING APPARATUS AND DISTANCE MEASURING METHOD

Time lag measuring device, distance measuring apparatus and distanc...

SURVEYING INSTRUMENT

Processing apparatus for pulsed signal and processing method for pu...

Light-wave rangefinder using a pulse method