Yoshikatsu UMEMURA

Person

Mishima-gun, Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,201,047
- Issue date Dec 14, 2021
- Shimadzu Corporation
- Tomoyuki Oshiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing apparatus
- Patent number 10,763,094
- Issue date Sep 1, 2020
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 10,739,320
- Issue date Aug 11, 2020
- Shimadzu Corporation
- Hideki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Mass-spectrometry-data processing system
- Patent number 10,557,837
- Issue date Feb 11, 2020
- Shimadzu Corporation
- Tetsuya Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry data processing apparatus
- Patent number 10,453,227
- Issue date Oct 22, 2019
- Shimadzu Corporation
- Hiroyuki Yasuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MS/MS mass spectrometric method and MS/MS mass spectrometer
- Patent number 10,192,724
- Issue date Jan 29, 2019
- Shimadzu Corporation
- Yoshikatsu Umemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis data analyzing method and mass analysis data analyzin...
- Patent number 8,666,681
- Issue date Mar 4, 2014
- Shimadzu Corporation
- Akira Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis data analyzing apparatus and program thereof
- Patent number 8,067,729
- Issue date Nov 29, 2011
- Shimadzu Corporation
- Kazuo Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for processing mass analysis data and mass spectrometer
- Patent number 8,044,347
- Issue date Oct 25, 2011
- Shimadzu Corporation
- Yoshitake Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,880,135
- Issue date Feb 1, 2011
- Shimadzu Corporation
- Yoshikatsu Umemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chromatograph/mass spectrometer
- Patent number 7,269,994
- Issue date Sep 18, 2007
- Shimadzu Corporation
- Yoshikatsu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Ion trap mass spectrometer
- Patent number 6,847,037
- Issue date Jan 25, 2005
- Shimadzu Corporation
- Yoshikatsu Umemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chromatograph/mass spectrometer
- Patent number 6,677,583
- Issue date Jan 13, 2004
- Shimadzu Corporation
- Yoshikatsu Umemura
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing a broad-band signal for an ion trap mass spectr...
- Patent number 6,624,411
- Issue date Sep 23, 2003
- Shimadzu Corporation
- Yoshikatsu Umemura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210242008
- Publication date Aug 5, 2021
- SHIMADZU CORPORATION
- Tomoyuki OSHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20200003739
- Publication date Jan 2, 2020
- SHIMADZU CORPORATION
- Hideki YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICAL DEVICE
- Publication number 20180218892
- Publication date Aug 2, 2018
- SHIMADZU CORPORATION
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MS/MS MASS SPECTROMETRIC METHOD AND MS/MS MASS SPECTROMETER
- Publication number 20170140909
- Publication date May 18, 2017
- SHIMADZU CORPORATION
- Yoshikatsu UMEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS-SPECTROMETRY-DATA PROCESSING DEVICE
- Publication number 20170131248
- Publication date May 11, 2017
- SHIMADZU CORPORATION
- Tetsuya KAGEYAMA
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY DATA PROCESSING APPARATUS
- Publication number 20160092151
- Publication date Mar 31, 2016
- Shimadzu Corporation
- Hiroyuki Yasuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass Analysis Data Analyzing Method and Mass Analysis Data Analyzin...
- Publication number 20110125416
- Publication date May 26, 2011
- SHIMADZU CORPORATION
- Akira Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS DATA ANALYZING APPARATUS AND PROGRAM THEREOF
- Publication number 20100228498
- Publication date Sep 9, 2010
- Shimadzu Corporation
- Kazuo Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PROCESSING MASS ANALYSIS DATA AND MASS SPECTROMETER
- Publication number 20090266983
- Publication date Oct 29, 2009
- Shimadzu Corporation
- Yoshitake YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20090166522
- Publication date Jul 2, 2009
- SHIMADZU CORPORATION
- Yoshikatsu Umemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS DATA ANALYZING APPARATUS AND PROGRAM THEREOF
- Publication number 20090026360
- Publication date Jan 29, 2009
- SHIMADZU CORPORATION
- Kazuo Yamauchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Chromatograph/mass spectrometer
- Publication number 20060101898
- Publication date May 18, 2006
- Shimadzu Corporation
- Yoshikatsu Umemura
- G01 - MEASURING TESTING
Information Patent Application
Ion trap mass spectrometer
- Publication number 20030213908
- Publication date Nov 20, 2003
- Shimadzu Corporation
- Yoshikatsu Umemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid chromatograph/mass spectrometer
- Publication number 20020074490
- Publication date Jun 20, 2002
- Shimadzu Corporation
- Yoshikatsu Umemura
- G01 - MEASURING TESTING
Information Patent Application
Method of producing a broad-band signal for an ion trap mass spectr...
- Publication number 20010010355
- Publication date Aug 2, 2001
- Shimadzu Corporation
- Yoshikatsu Umemura
- G01 - MEASURING TESTING

Yoshikatsu UMEMURA

Person

Patents Grantslast 30 patents

Time-of-flight mass spectrometer

Analyzing apparatus

Mass spectrometer

Mass-spectrometry-data processing system

Mass spectrometry data processing apparatus

MS/MS mass spectrometric method and MS/MS mass spectrometer

Mass analysis data analyzing method and mass analysis data analyzin...

Mass analysis data analyzing apparatus and program thereof

Method for processing mass analysis data and mass spectrometer

Mass spectrometer

Chromatograph/mass spectrometer

Ion trap mass spectrometer

Liquid chromatograph/mass spectrometer

Method of producing a broad-band signal for an ion trap mass spectr...

Patents Applicationslast 30 patents

TIME-OF-FLIGHT MASS SPECTROMETER

MASS SPECTROMETER

ANALYTICAL DEVICE

MS/MS MASS SPECTROMETRIC METHOD AND MS/MS MASS SPECTROMETER

MASS-SPECTROMETRY-DATA PROCESSING DEVICE

MASS SPECTROMETRY DATA PROCESSING APPARATUS

Mass Analysis Data Analyzing Method and Mass Analysis Data Analyzin...

MASS ANALYSIS DATA ANALYZING APPARATUS AND PROGRAM THEREOF

METHOD FOR PROCESSING MASS ANALYSIS DATA AND MASS SPECTROMETER

MASS SPECTROMETER

MASS ANALYSIS DATA ANALYZING APPARATUS AND PROGRAM THEREOF

Chromatograph/mass spectrometer

Ion trap mass spectrometer

Liquid chromatograph/mass spectrometer

Method of producing a broad-band signal for an ion trap mass spectr...