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Yoshikazu Abe
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for manufacturing bimorph actuator
Patent number
9,343,655
Issue date
May 17, 2016
Advantest Corporation
Hisao Hori
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Switching apparatus and test apparatus
Patent number
9,030,077
Issue date
May 12, 2015
Advantest Corporation
Hisao Hori
G01 - MEASURING TESTING
Information
Patent Grant
Actuator apparatus, test apparatus, and test method
Patent number
8,981,617
Issue date
Mar 17, 2015
Advantest Corporation
Yoshikazu Abe
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Switching apparatus, switching apparatus manufacturing method, tran...
Patent number
8,872,524
Issue date
Oct 28, 2014
Advantest Corporation
Hisao Hori
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method, switching apparatus, transmission line switch...
Patent number
8,866,492
Issue date
Oct 21, 2014
Advantest Corporation
Hisao Hori
G01 - MEASURING TESTING
Information
Patent Grant
Switching apparatus and test apparatus
Patent number
8,841,918
Issue date
Sep 23, 2014
Advantest Corporation
Hisao Hori
G01 - MEASURING TESTING
Information
Patent Grant
Switching apparatus and test apparatus
Patent number
8,779,751
Issue date
Jul 15, 2014
Advantest Corporation
Hisao Hori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Variable capacitor, resonator and modulator
Patent number
7,965,491
Issue date
Jun 21, 2011
Advantest Corporation
Yoshikazu Abe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single crystalline magnetic garnet and YIG device
Patent number
7,378,926
Issue date
May 27, 2008
Advantest Corp.
Yoshikazu Abe
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
ACTUATOR APPARATUS, TEST APPARATUS, AND TEST METHOD
Publication number
20130285505
Publication date
Oct 31, 2013
Advantest Corporation
Yoshikazu ABE
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SWITCHING APPARATUS AND TEST APPARATUS
Publication number
20130038335
Publication date
Feb 14, 2013
Advantest Corporation
Hisao HORI
G01 - MEASURING TESTING
Information
Patent Application
SWITCHING APPARATUS AND TEST APPARATUS
Publication number
20130037395
Publication date
Feb 14, 2013
Advantest Corporation
Hisao HORI
G01 - MEASURING TESTING
Information
Patent Application
ACTUATOR MANUFACTURING METHOD, SWITCHING APPARATUS, TRANSMISSION LI...
Publication number
20130026021
Publication date
Jan 31, 2013
Advantest Corporation
Hisao HORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SWITCHING APPARATUS, SWITCHING APPARATUS MANUFACTURING METHOD, TRAN...
Publication number
20130027057
Publication date
Jan 31, 2013
Advantest Corporation
Hisao HORI
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD, SWITCHING APPARATUS, TRANSMISSION LINE SWITCH...
Publication number
20120286801
Publication date
Nov 15, 2012
Advantest Corporation
Hisao HORI
G01 - MEASURING TESTING
Information
Patent Application
SWITCHING APPARATUS AND TEST APPARATUS
Publication number
20120268102
Publication date
Oct 25, 2012
Advantest Corporation
Hisao HORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VARIABLE CAPACITOR, RESONATOR AND MODULATOR
Publication number
20090268367
Publication date
Oct 29, 2009
Advantest Corporation
Yoshikazu ABE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Single crystalline magnetic garnet and YIG device
Publication number
20060214750
Publication date
Sep 28, 2006
Yoshikazu Abe
C30 - CRYSTAL GROWTH