Yoshikazu Aikawa

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Tokyo, JP

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Patents Applicationslast 30 patents

Information Patent Application
Process fault analyzer and method and storage medium
- Publication number 20070255442
- Publication date Nov 1, 2007
- OMRON CORPORATION
- Toshikazu Nakamura
- G05 - CONTROLLING REGULATING
Information Patent Application
Process fault analyzer and system, program and method thereof
- Publication number 20070192064
- Publication date Aug 16, 2007
- OMRON CORPORATION
- Toshikazu Nakamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and program for process fault analysis
- Publication number 20070180324
- Publication date Aug 2, 2007
- OMRON CORPORATION
- Toshikazu Nakamura
- G05 - CONTROLLING REGULATING
Information Patent Application
Model generating apparatus, model generating system, and fault dete...
- Publication number 20070135957
- Publication date Jun 14, 2007
- OMRON CORPORATION
- Makoto Ogawa
- G05 - CONTROLLING REGULATING
Information Patent Application
Device for and method of creating a model for determining relations...
- Publication number 20050159835
- Publication date Jul 21, 2005
- Kentaro Yamada
- G06 - COMPUTING CALCULATING COUNTING