Yoshikazu Iizuka

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Failure analysis system of semiconductor device, failure analysis m...
- Patent number 12,235,770
- Issue date Feb 25, 2025
- Kioxia Corporation
- Mami Kodama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device failure analysis system and semiconductor memo...
- Patent number 9,128,143
- Issue date Sep 8, 2015
- Kabushiki Kaisha Toshiba
- Mami Kodama
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analyzing device and failure analyzing method
- Patent number 8,479,063
- Issue date Jul 2, 2013
- Kabushiki Kaisha Toshiba
- Yoshikazu Iizuka
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analysis method, failure analysis apparatus, and computer p...
- Patent number 8,316,264
- Issue date Nov 20, 2012
- Kabushiki Kaisha Toshiba
- Yoshikazu Iizuka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor apparatus and testing method
- Patent number 7,716,549
- Issue date May 11, 2010
- Kabushiki Kaisha Toshiba
- Yoshikazu Iizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault position identification system for a semiconductor device and...
- Patent number 7,238,958
- Issue date Jul 3, 2007
- Kabushiki Kaisha Toshiba
- Yoshikazu Iizuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAILURE ANALYSIS SYSTEM OF SEMICONDUCTOR DEVICE, FAILURE ANALYSIS M...
- Publication number 20220066854
- Publication date Mar 3, 2022
- KIOXIA Corporation
- Mami KODAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE FAILURE ANALYSIS SYSTEM AND SEMICONDUCTOR MEMO...
- Publication number 20140043360
- Publication date Feb 13, 2014
- Kabushiki Kaisha Toshiba
- Mami KODAMA
- G01 - MEASURING TESTING
Information Patent Application
FAILURE ANALYZING DEVICE AND FAILURE ANALYZING METHOD
- Publication number 20120036405
- Publication date Feb 9, 2012
- Yoshikazu IIZUKA
- G11 - INFORMATION STORAGE
Information Patent Application
FAIL ANALYSIS SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20120011421
- Publication date Jan 12, 2012
- Mami KODAMA
- G11 - INFORMATION STORAGE
Information Patent Application
FAILURE ANALYSIS METHOD, FAILURE ANALYSIS APPARATUS, AND COMPUTER P...
- Publication number 20110154138
- Publication date Jun 23, 2011
- Yoshikazu Iizuka
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor apparatus and testing method
- Publication number 20080059851
- Publication date Mar 6, 2008
- Kabushiki Kaisha Toshiba
- Yoshikazu Iizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fault position identification system for a semiconductor device and...
- Publication number 20050229063
- Publication date Oct 13, 2005
- Yoshikazu Iizuka
- G01 - MEASURING TESTING

Yoshikazu Iizuka

Person

Patents Grantslast 30 patents

Failure analysis system of semiconductor device, failure analysis m...

Semiconductor device failure analysis system and semiconductor memo...

Failure analyzing device and failure analyzing method

Failure analysis method, failure analysis apparatus, and computer p...

Semiconductor apparatus and testing method

Fault position identification system for a semiconductor device and...

Patents Applicationslast 30 patents

FAILURE ANALYSIS SYSTEM OF SEMICONDUCTOR DEVICE, FAILURE ANALYSIS M...

SEMICONDUCTOR DEVICE FAILURE ANALYSIS SYSTEM AND SEMICONDUCTOR MEMO...

FAILURE ANALYZING DEVICE AND FAILURE ANALYZING METHOD

FAIL ANALYSIS SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE

FAILURE ANALYSIS METHOD, FAILURE ANALYSIS APPARATUS, AND COMPUTER P...

Semiconductor apparatus and testing method

Fault position identification system for a semiconductor device and...