Yoshikazu Kaneko

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Manufacturing method of pressure sensor and pressure sensor
- Patent number 7,748,276
- Issue date Jul 6, 2010
- Nagano Keiki Co., Ltd.
- Yoshikazu Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Strain detector and method of manufacturing the same
- Patent number 7,263,895
- Issue date Sep 4, 2007
- Nagano Keiki Co., Ltd.
- Hiroshi Nagasaka
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 7,150,198
- Issue date Dec 19, 2006
- Nagano Keiki Co., Ltd.
- Yoshikazu Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Absolute-pressure type of pressure sensor
- Patent number 6,883,379
- Issue date Apr 26, 2005
- Nagano Keiki Co., Ltd.
- Yoshikazu Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Method for production of silicon thin film piezoresistive devices
- Patent number 4,657,775
- Issue date Apr 14, 1987
- Kabushiki Kaisha Nagano Keiki Seisakusho
- Hisanori Shioiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silane coupling agent in protective layer of photoconductive element
- Patent number 4,148,637
- Issue date Apr 10, 1979
- Ricoh Co., Ltd.
- Tomio Kubota
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MANUFACTURING METHOD OF PRESSURE SENSOR AND PRESSURE SENSOR
- Publication number 20090056462
- Publication date Mar 5, 2009
- NAGANO KEIKI CO., LTD.
- Yoshikazu Kaneko
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20060016265
- Publication date Jan 26, 2006
- NAGANO KEIKI CO., LTD.
- Yoshikazu Kaneko
- G01 - MEASURING TESTING
Information Patent Application
Strain detector and method of manufacturing the same
- Publication number 20060016268
- Publication date Jan 26, 2006
- NAGANO KEIKI CO., LTD.
- Hiroshi Nagasaka
- G01 - MEASURING TESTING
Information Patent Application
Absolute-pressure type of pressure sensor
- Publication number 20030213307
- Publication date Nov 20, 2003
- Nagano Keiki Co., Ltd.
- Yoshikazu Kaneko
- G01 - MEASURING TESTING