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Yoshikazu Nakayama
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement apparatus and measurement method
Patent number
9,229,037
Issue date
Jan 5, 2016
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Device, method, and program for determining element, recording medi...
Patent number
8,203,347
Issue date
Jun 19, 2012
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Device, method, program, and recording medium for error factor dete...
Patent number
8,076,947
Issue date
Dec 13, 2011
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, network analyzing method, program, and recording...
Patent number
7,996,184
Issue date
Aug 9, 2011
Rohde & Schwarz GmbH & Co., KG
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Device, method, program, and recording medium for error factor meas...
Patent number
7,761,253
Issue date
Jul 20, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, network analyzing method, automatic corrector, co...
Patent number
7,652,482
Issue date
Jan 26, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Device, method, program, and recording medium for error factor meas...
Patent number
7,616,007
Issue date
Nov 10, 2009
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, network analyzing method, program, and recording...
Patent number
7,561,987
Issue date
Jul 14, 2009
Rohde & Schwarz GmbH & Co. KG
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, transmission tracking error measuring method, net...
Patent number
7,519,509
Issue date
Apr 14, 2009
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Fixture characteristic measuring device, method, program, recording...
Patent number
7,511,508
Issue date
Mar 31, 2009
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Grant
Multi-port analysis apparatus and method and calibration method the...
Patent number
7,359,814
Issue date
Apr 15, 2008
Advantest
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Error factor acquisition device, method, program, and recording medium
Patent number
7,348,784
Issue date
Mar 25, 2008
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Grant
Power supply device, method, program, recording medium, network ana...
Patent number
7,302,351
Issue date
Nov 27, 2007
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, network analytical method and recording medium
Patent number
6,496,785
Issue date
Dec 17, 2002
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Multi-port device analysis apparatus and method and calibration met...
Patent number
6,421,624
Issue date
Jul 16, 2002
Advantest Corp.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Multi-port device analysis apparatus and method
Patent number
6,347,382
Issue date
Feb 12, 2002
Advantest Corp.
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection using the propagation characteristics of RF el...
Patent number
6,320,401
Issue date
Nov 20, 2001
Advantest Corporation
Yoshimi Sugimoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
Publication number
20140062455
Publication date
Mar 6, 2014
Advantest Corporation
Yoshikazu NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM FOR ERROR FACTOR DETE...
Publication number
20100225301
Publication date
Sep 9, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, METHOD, AND PROGRAM FOR DETERMINING ELEMENT, RECORDING MEDI...
Publication number
20100042347
Publication date
Feb 18, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
NETWORK ANALYZER, NETWORK ANALYZING METHOD, PROGRAM, AND RECORDING...
Publication number
20090276177
Publication date
Nov 5, 2009
ROHDE &SCHWARZ GMBH & CO. KG
Yoshikazu NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
Device, Method, Program, and Recording Medium for Error Factor Meas...
Publication number
20090030633
Publication date
Jan 29, 2009
Advantest Corporation
Yoshikazu NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM FOR ERROR FACTOR MEAS...
Publication number
20090031172
Publication date
Jan 29, 2009
Advantest Corporation
Yoshikazu NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
Network Analyzer, Transmission Tracking Error Measuring Method, Net...
Publication number
20070285108
Publication date
Dec 13, 2007
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Fixture Characteristic Measuring Device, Method, Program, Recording...
Publication number
20070222455
Publication date
Sep 27, 2007
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Application
Network analyzer, network analyzing method, program, and recording...
Publication number
20070143051
Publication date
Jun 21, 2007
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Error factor acquisition device, method, program, and recording medium
Publication number
20070029989
Publication date
Feb 8, 2007
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Application
Method of determining airbag deployment tolerance
Publication number
20060201242
Publication date
Sep 14, 2006
TAKATA CORPORATION
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Network analyzer, network analyzing method, automatic corrector, co...
Publication number
20060005065
Publication date
Jan 5, 2006
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Power supply device, method, program, recording medium, network ana...
Publication number
20050289392
Publication date
Dec 29, 2005
Masato Haruta
H03 - BASIC ELECTRONIC CIRCUITRY