Yoshiki Fujii

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of setting reference data for inspection of fillets and insp...
- Patent number 7,961,933
- Issue date Jun 14, 2011
- Omron Corporation
- Yoshiki Fujii
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Substrate inspection system including a visual inspection device fo...
- Patent number 7,672,501
- Issue date Mar 2, 2010
- Omron Corporation
- Taku Minakata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection data producing method and board inspection apparatus usi...
- Patent number 7,406,191
- Issue date Jul 29, 2008
- Omron Corporation
- Yoshiki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Mounting-error inspecting method and substrate inspecting apparatus...
- Patent number 7,356,176
- Issue date Apr 8, 2008
- Omron Corporation
- Yoshiki Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting curved surface and device for inspecting print...
- Patent number 7,062,080
- Issue date Jun 13, 2006
- Omron Corporation
- Akira Oshiumi
- G01 - MEASURING TESTING
Information Patent Grant
Surface state inspecting method and substrate inspecting apparatus
- Patent number 6,947,151
- Issue date Sep 20, 2005
- Omron Corporation
- Yoshiki Fujii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of setting reference data for inspection of fillets and insp...
- Publication number 20080040058
- Publication date Feb 14, 2008
- OMRON CORPORATION
- Yoshiki Fujii
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Substrate inspection system
- Publication number 20070058853
- Publication date Mar 15, 2007
- Taku Minakata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mounting-error inspecting method and substrate inspecting apparatus...
- Publication number 20050190956
- Publication date Sep 1, 2005
- OMRON CORPORATION
- Yoshiki Fujii
- G01 - MEASURING TESTING
Information Patent Application
Inspection data producing method and board inspection apparatus usi...
- Publication number 20040076323
- Publication date Apr 22, 2004
- OMRON CORPORATION
- Yoshiki Fujii
- G01 - MEASURING TESTING
Information Patent Application
Surface state inspecting method and substrate inspecting apparatus
- Publication number 20030169418
- Publication date Sep 11, 2003
- OMRON CORPORATION
- Yoshiki Fujii
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting curved surface and device for inspecting print...
- Publication number 20030099393
- Publication date May 29, 2003
- OMRON CORPORATION
- Akira Oshiumi
- G01 - MEASURING TESTING